Patents Assigned to Inspection Technology, Inc.
  • Microfinish measurement apparatus and technique
    Patent number: 4476489
    Abstract: An apparatus and technique for measuring microfinishes of workpieces at on-line speeds. A digitized image of a finished surface of a workpiece is generated. Under microprocessor control, a distribution of the digitized values is obtained. This distribution is compared against pre-stored distributions of known surface finishes to determine the type of finish of the workpiece and/or the acceptability of the finish. The comparison is obtained using curve matching techniques and by comparison of mean gray level values.
    Type: Grant
    Filed: May 20, 1982
    Date of Patent: October 9, 1984
    Assignee: Inspection Technology, Inc.
    Inventors: Gary P. Weltlich, Gary G. Wagner