Patents Assigned to Inspecto Inc.
  • Three-dimensional profile measurement apparatus and method using amplitude size of projection grid
    Patent number: 9360306
    Abstract: Disclosed are a three-dimensional profile measurement apparatus and method using the amplitude size of a projection grid wherein a periodic pattern of the projection grid is projected onto an object to be measured, the amplitude of the projection grid is obtained through the change of the pattern of the projection grid, and the amplitude size is continuously obtained while moving the object upwards and downwards, thus measuring the three-dimensional profile of the object.
    Type: Grant
    Filed: September 7, 2012
    Date of Patent: June 7, 2016
    Assignee: INSPECTO INC.
    Inventor: Yoon Deok Park
  • THREE-DIMENSIONAL PROFILE MEASUREMENT APPARATUS AND METHOD USING AMPLITUDE SIZE OF PROJECTION GRID
    Publication number: 20140198320
    Abstract: Disclosed are a three-dimensional profile measurement apparatus and method using the amplitude size of a projection grid wherein a periodic pattern of the projection grid is projected onto an object to be measured, the amplitude of the projection grid is obtained through the change of the pattern of the projection grid, and the amplitude size is continuously obtained while moving the object upwards and downwards, thus measuring the three-dimensional profile of the object.
    Type: Application
    Filed: September 7, 2012
    Publication date: July 17, 2014
    Applicant: Inspecto Inc.
    Inventor: Yoon Deok Park