Patents Assigned to INSTITUTO NACIONAL DE METROLOGIA QUALIDADE E TECNOLOGIA—INMETRO
  • Patent number: 10274514
    Abstract: The present invention relates to a metallic device for near-field optical microscopy and spectroscopy, as well as to a method of preparing it. Said device comprises a single body (1) with longitudinal prolongation (2), nanometric apex (4) and has at least one trimming (3) on its surface, being applied as a probe of high optical efficiency, with adequate dimensions and details that enable the best photon-plasmon coupling, enabling the analysis, with high space resolution, of structures of nanometric dimensions with high efficiency and reproducibility.
    Type: Grant
    Filed: May 6, 2016
    Date of Patent: April 30, 2019
    Assignees: UNIVERSIDADE FEDERAL DE MINAS GERAIS—UFMG, INSTITUTO NACIONAL DE METROLOGIA QUALIDADE E TECNOLOGIA—INMETRO
    Inventors: Thiago De Lourenço E Vasconcelos, Bráulio Soares Archanjo, Luiz Gustavo De Oliveira Lopes Cançado, Carlos Alberto Achete, Wagner Nunes Rodrigues, Ado Jorio De Vasconcelos, Benjamin Fragneaud, Douglas Dos Santos Ribeiro, Cassiano Rabelo E Silva, Bruno Santos De Oliveira