Patents Assigned to Inston, Inc.
  • Patent number: 10861527
    Abstract: Systems and methods for reducing write error rate in MeRAM applications in accordance with various embodiments of the invention are illustrated. One embodiment includes a method for a writing mechanism for a magnetoelectric random access memory cell, the method including applying a voltage of a given polarity for a given period of time across a magnetoelectric junction bit of the magnetoelectric random access memory cell, wherein application of the voltage of the given polarity across the magnetoelectric junction bit reduces the perpendicular magnetic anisotropy and magnetic coercivity of the ferromagnetic free layer through a voltage controlled magnetic anisotropy effect, and lowering the applied voltage of the given polarity before the end of the given period of time, wherein the given period of time is approximately half of a precessional period of the ferromagnetic free layer.
    Type: Grant
    Filed: October 2, 2019
    Date of Patent: December 8, 2020
    Assignee: Inston, Inc.
    Inventors: Albert Lee, Hochul Lee
  • Publication number: 20200035282
    Abstract: Systems and methods for reducing write error rate in MeRAM applications in accordance with various embodiments of the invention are illustrated. One embodiment includes a method for a writing mechanism for a magnetoelectric random access memory cell, the method including applying a voltage of a given polarity for a given period of time across a magnetoelectric junction bit of the magnetoelectric random access memory cell, wherein application of the voltage of the given polarity across the magnetoelectric junction bit reduces the perpendicular magnetic anisotropy and magnetic coercivity of the ferromagnetic free layer through a voltage controlled magnetic anisotropy effect, and lowering the applied voltage of the given polarity before the end of the given period of time, wherein the given period of time is approximately half of a precessional period of the ferromagnetic free layer.
    Type: Application
    Filed: October 2, 2019
    Publication date: January 30, 2020
    Applicant: Inston, Inc.
    Inventors: Albert Lee, Hochul Lee
  • Patent number: 10460786
    Abstract: Reverse pulse schemes for reducing write error rate in magnetoelectric random access memory applications can be implemented in many different ways in accordance with various embodiments of the invention. One embodiment includes a method for a writing mechanism for a magnetoelectric random access memory cell, the method including applying a voltage of a given polarity for a period of time across a magnetoelectric junction bit of the magnetoelectric random access memory cell and applying a voltage of a polarity opposite the given polarity across the magnetoelectric junction bit at the end of the application of the voltage of the given polarity, wherein application of the voltage of the given polarity across the magnetoelectric junction bit reduces the perpendicular magnetic anisotropy and magnetic coercivity of the ferromagnetic free layer through a voltage controlled magnetic anisotropy effect.
    Type: Grant
    Filed: June 27, 2018
    Date of Patent: October 29, 2019
    Assignee: Inston, Inc.
    Inventors: Albert Lee, Hochul Lee
  • Patent number: 10217798
    Abstract: Systems and methods in accordance with embodiments of the invention implement select devices constructed from 2D materials. In one embodiment, a crossbar memory system includes: a first set of connection lines; a second set of connection lines; and an array of memory cells, each memory cell including: a select device; and a memory device; where each memory cell is coupled to a unique combination of: at least one connection line from the first set of connection lines, and at least one connection line from the second set of connection lines; and where at least one select device includes a 2D material.
    Type: Grant
    Filed: January 13, 2016
    Date of Patent: February 26, 2019
    Assignee: Inston, Inc.
    Inventors: Qi Hu, Kang L. Wang
  • Patent number: 10103317
    Abstract: Systems and methods in accordance with embodiments of the invention implement efficient magnetoelectric junctions (MEJs). In one embodiment, an MEJ system includes: at least one MEJ, and a first layer including a piezoelectric material disposed proximate at least one MEJ; where the straining of at least some portion of the first layer including a piezoelectric material causes at least some portion of at least one MEJ to experience a stress and a related strain.
    Type: Grant
    Filed: April 8, 2015
    Date of Patent: October 16, 2018
    Assignee: Inston, Inc.
    Inventor: Qi Hu
  • Publication number: 20160204162
    Abstract: Systems and methods in accordance with embodiments of the invention implement select devices constructed from 2D materials. In one embodiment, a crossbar memory system includes: a first set of connection lines; a second set of connection lines; and an array of memory cells, each memory cell including: a select device; and a memory device; where each memory cell is coupled to a unique combination of: at least one connection line from the first set of connection lines, and at least one connection line from the second set of connection lines; and where at least one select device includes a 2D material.
    Type: Application
    Filed: January 13, 2016
    Publication date: July 14, 2016
    Applicant: Inston, Inc.
    Inventors: Qi Hu, Kang Wang
  • Publication number: 20140124882
    Abstract: Embodiments of the invention implement MEJs having improved read-write characteristics. In one embodiment, an MEJ includes: ferromagnetic fixed and free layers, a dielectric layer interposed between the ferromagnetic layers, and an additional dielectric layer proximate the free layer, where the fixed layer is magnetically polarized in a first direction, where the free layer has a first easy axis that is aligned with the first direction, and where the MEJ is configured such that when subject to a potential difference, the magnetic anisotropy of the free layer is altered such that the relative strength of the magnetic anisotropy along a second easy axis that is orthogonal to the first easy axis, compared to the strength of the magnetic anisotropy along the first easy axis, is magnified during the application of the potential difference, where the extent of the magnification is enhanced by the presence of the additional layer.
    Type: Application
    Filed: November 6, 2013
    Publication date: May 8, 2014
    Applicant: Inston, Inc.
    Inventors: Pedram Khalili Amiri, Kang L. Wang