Abstract: The invention relates to a method for monitoring a spectroradiometer (4), in particular for measuring light-emitting test objects (1), in which the spectral data of the test objects (1) are captured by means of an optical system, wherein the radiometric, photometric and/or colorimetric quantities of the test objects (1) are ascertained from the spectral data. The problem addressed by the invention is that of specifying a method for monitoring a spectroradiometer (4), where it is not the continuous recalibration of the spectroradiometer (4) but the monitoring of when a calibration is necessary that is paramount. The invention solves this problem by virtue of changes in the wavelength scale, in the light throughput and/or in the spectral sensitivity of the spectroradiometer (4) being detected by way of a reference light source (5), integrated into the optical system, with a defined spectrum.

Abstract: The invention relates to a method for the sequential measurement of a plurality of semiconductor-based light sources such as LEDs, OLEDs or VCSELs, in particular comparatively low-luminosity light sources such as so-called micro-LEDs. The invention further relates to a device for carrying out the method. The object of the present invention is to provide a method that operates faster, more accurately and more sensitively than the known methods, which operate by scanning with a photodiode or with a spectrometer. The method according to the invention proposes for this that a current pulse is applied by means of a pulsed current source (1) to the low-luminosity light sources consecutively or simultaneously.

Abstract: A spectro-colorimeter system for imaging pipeline is provided, the system including a camera system; a spectrometer system; and a controller coupling the camera system and the spectrometer system. In some embodiments the camera system is configured to provide a color image with the first portion of the incident light. Also, in some embodiments the spectrometer system is configured to provide a tristimulus signal from the second portion of the incident light. Furthermore, in some embodiments the controller is configured to correct the color image from the camera system using the tristimulus signal from the spectrometer. An imaging pipeline method for using a system as above is also provided. Further, a method for color selection in an imaging pipeline calibration is provided.

Abstract: The invention relates to a method for monitoring a spectroradiometer (4), in particular for measuring light-emitting test objects (1), in which the spectral data of the test objects (1) are captured by means of an optical system, wherein the radiometric, photometric and/or colorimetric quantities of the test objects (1) are ascertained from the spectral data. The problem addressed by the invention is that of specifying a method for monitoring a spectroradiometer (4), where it is not the continuous recalibration of the spectroradiometer (4) but the monitoring of when a calibration is necessary that is paramount. The invention solves this problem by virtue of changes in the wavelength scale, in the light throughput and/or in the spectral sensitivity of the spectroradiometer (4) being detected by way of a reference light source (5), integrated into the optical system, with a defined spectrum.

Abstract: The invention relates to a method for calibrating a spectroradiometer (1), comprising the following method steps: capture of light measurement data by the measurement of the radiation of at least one standard light source (4) using the spectroradiometer (1) that is to be calibrated; derivation of calibrated data from the light measurement data by the comparison of the captured light measurement data with known data of the standard light source (4); and calibration of the spectroradiometer (1) according to the calibration data. The aim of the invention is to provide a reliable and practical method for calibrating the spectroradiometer (1). In particular, the synchronism of spectroradiometers (1) situated in different locations (9, 10, 11) is to be produced simply and reliably. To achieve this aim, the validity, i.e.

Abstract: The invention relates to an apparatus for generating light, comprising a plurality of light sources (1), —a control device (2), which drives the light sources (1), and a superimposition optical unit, which superimposes the light emitted by the light sources (1) in an exit opening (3). It is an object of the invention to provide an apparatus which is improved compared with the prior art. For this purpose, the invention proposes that the superimposition optical unit comprises a first concave mirror (4), in the focal plane of which the light sources (1) are situated, an optical grating (5), onto which the first concave mirror (4) reflects the light (6) emitted by the light sources (1), and —a second concave mirror (7), which reflects the light (8) diffracted at the optical grating (5) onto the exit opening (3) situated at the focus of the second concave mirror (7).

Abstract: The invention relates to a method for two-dimensional, spatially resolved measurement of tristimulus values of light emitted from a plurality of positions on a sample. It is an object of the invention to provide an improved method and system for spatially resolved chromaticity and luminance measurement in a standardized color space for display testing. The method of the invention comprises the steps of: directing a first portion of the light to an RGB camera which produces a two-dimensional map of RGB color values; transforming the RGB color values into first tristimulus values to produce a map of tristimulus values; directing a second portion of the light to a colorimeter which produces second tristimulus values; deriving a tristimulus correction by comparing the second tristimulus values with at least a subset of the first tristimulus values; and applying the tristimulus correction to the first tristimulus values to produce a corrected map of tristimulus values.

Abstract: The invention relates to an apparatus for generating light, comprising a plurality of light sources (1), —a control device (2), which drives the light sources (1), and a superimposition optical unit, which superimposes the light emitted by the light sources (1) in an exit opening (3). It is an object of the invention to provide an apparatus which is improved compared with the prior art. For this purpose, the invention proposes that the superimposition optical unit comprises a first concave mirror (4), in the focal plane of which the light sources (1) are situated, an optical grating (5), onto which the first concave mirror (4) reflects the light (6) emitted by the light sources (1), and —a second concave mirror (7), which reflects the light (8) diffracted at the optical grating (5) onto the exit opening (3) situated at the focus of the second concave mirror (7).

Abstract: The invention relates to a method for calibrating a spectroradiometer (1), comprising the following method steps: capture of light measurement data by the measurement of the radiation of at least one standard light source (4) using the spectroradiometer (1) that is to be calibrated; derivation of calibrated data from the light measurement data by the comparison of the captured light measurement data with known data of the standard light source (4); and calibration of the spectroradiometer (1) according to the calibration data. The aim of the invention is to provide a reliable and practical method for calibrating the spectroradiometer (1). In particular, the synchronism of spectroradiometers (1) situated in different locations (9, 10, 11) is to be produced simply and reliably. To achieve this aim, the validity, i.e.

Abstract: The invention relates to a method for two-dimensional, spatially resolved measurement of tristimulus values of light emitted from a plurality of positions on a sample. It is an object of the invention to provide an improved method and system for spatially resolved chromaticity and luminance measurement in a standardized color space for display testing. The method of the invention comprises the steps of: directing a first portion of the light to an RGB camera which produces a two-dimensional map of RGB color values; transforming the RGB color values into first tristimulus values to produce a map of tristimulus values; directing a second portion of the light to a colorimeter which produces second tristimulus values; deriving a tristimulus correction by comparing the second tristimulus values with at least a subset of the first tristimulus values; and applying the tristimulus correction to the first tristimulus values to produce a corrected map of tristimulus values.

Abstract: An optical test equipment/method for display testing that features parallel testing/sensing configuration that covers spectrum and colorimetric quantities with spatial resolution is disclosed. In one embodiment, a spectra-camera, which is a hybrid system consisting of both a single-point spectrometer and an imaging colorimeter, can be configured for concurrent display artifact and parametric testing. An aperture mirror with a hole in the middle splits an image of a test display into two parts. One part of the image passes through the hole and is directed to the spectrometer for display parametric testing. The rest of the image is reflected off the aperture mirror for concurrent display artifact testing with the colorimeter. In another embodiment, a beam splitter can be used instead of an aperture mirror. In yet another embodiment, the single-point high accuracy spectrometer can be used to calibrate the low accuracy imaging colorimeter.

Abstract: The invention relates to a calibration radiation source comprising the following: a housing (2) having an opening (12), a board (22) held in the housing (2), a semiconductor radiation source (18) mounted on the board (22) for generating a light beam, and an exit opening support element (14) having, in the area of the opening (12), a light exit opening (15) through which the light beam radiates outwards from the housing (2). The exit opening support element (14) is decoupled from the housing (2), and is attached to the board (22) of the semiconductor radiation source (18).