Patents Assigned to Instrumental, Inc.
  • Patent number: 11132787
    Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: September 28, 2021
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Tilmann Bruckhaus, Shilpi Kumar, Isaac Sukin, Ian Theilacker, Brendan Green
  • Patent number: 10984526
    Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.
    Type: Grant
    Filed: June 9, 2020
    Date of Patent: April 20, 2021
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
  • Patent number: 10789701
    Abstract: One variation of a method for predicting manufacturing defects includes: accessing a set of inspection images of a set of assembly units recorded by an optical inspection station; for each inspection image in the set of inspection images, detecting a set of features in the inspection image and generating a vector representing the set of features in a multi-dimensional feature space; grouping neighboring vectors in the multi-dimensional feature space into a set of vector groups; and, in response to receipt of a first inspection result indicting a defect in a first assembly unit, in the set of assembly units, associated with a first vector in a first vector group, in the set of vector groups, labeling the first vector group with the defect and flagging a second assembly unit associated with a second vector, in the first vector group, as exhibiting characteristics of the defect.
    Type: Grant
    Filed: April 13, 2018
    Date of Patent: September 29, 2020
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
  • Patent number: 10783624
    Abstract: One variation of an optical inspection kit includes: an enclosure defining an imaging volume; an optical sensor adjacent the imaging volume and defining a field of view directed toward the imaging volume; a nest module defining a receptacle configured to locate a surface of interest on a first unit of a first part within the imaging volume at an image plane of the optical sensor; a dark-field lighting module adjacent and perpendicular to the nest module and including a dark-field light source configured to output light across a light plane and a directional light filter configured to pass light output by the dark-field light source normal to the light plane and to reject light output by the dark-field light source substantially nonparallel to the light plane; and a bright-field light source proximal the optical sensor and configured to output light toward the surface of interest.
    Type: Grant
    Filed: July 18, 2017
    Date of Patent: September 22, 2020
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky
  • Patent number: 10713776
    Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.
    Type: Grant
    Filed: April 13, 2018
    Date of Patent: July 14, 2020
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, Simon Kozlov, Ana Ulin, Mikhail Okunev, Isaac Sukin
  • Patent number: 10325363
    Abstract: A method includes: displaying a first image of a first assembly unit within a user interface; locating a first virtual origin at a first feature on the first assembly unit; displaying a first subregion of the first image within the user interface responsive to a change in a view window of the first image; recording a geometry and a position of the first subregion relative to the first virtual origin; locating a second virtual origin at a second feature—analogous to the first feature—on a second assembly unit represented in the second image; projecting the geometry and the position of the first subregion onto the second image according to the second virtual origin to define a second subregion of the second image; and, in response to receipt of a command to advance from the first image to the second image, displaying the second subregion within the user interface.
    Type: Grant
    Filed: January 16, 2017
    Date of Patent: June 18, 2019
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, John James Shedletsky, III, Isaac Sukin, Simon Kozlov
  • Patent number: 10198808
    Abstract: One variation of a method for automatically generating a common measurement across multiple assembly units includes: displaying a first image—recorded at an optical inspection station—within a user interface; receiving manual selection of a particular feature in a first assembly unit represented in the first image; receiving selection of a measurement type for the particular feature; extracting a first real dimension of the particular feature in the first assembly unit from the first image according to the measurement type; for each image in a set of images, identifying a feature—analogous to the particular feature—in an assembly unit represented in the image and extracting a real dimension of the feature in the assembly unit from the image according to the measurement type; and aggregating the first real dimension and a set of real dimensions extracted from the set of images into a digital container.
    Type: Grant
    Filed: January 16, 2017
    Date of Patent: February 5, 2019
    Assignee: Instrumental, Inc.
    Inventors: Samuel Bruce Weiss, Anna-Katrina Shedletsky, John James Shedletsky, III, Isaac Sukin, Simon Kozlov
  • Patent number: 8829885
    Abstract: Provided is a voltage reference circuit which is able to obtain high PSRR without a variation in power-supply voltage and an influence of noise. A voltage reference circuit for performing voltage-current conversion on forward voltages of PN junction elements and on a difference therebetween to generate a voltage so as not to depend on a temperature is constituted by an amplifier for controlling a temperature characteristic of a voltage of an output terminal, a source follower circuit for supplying a power to the amplifier, and a PMOS transistor which is controlled by the amplifier and which controls a current to flow into the PN junction elements.
    Type: Grant
    Filed: March 4, 2013
    Date of Patent: September 9, 2014
    Assignee: Seiko Instrumentals Inc.
    Inventors: Nao Otsuka, Kosuke Takada