Patents Assigned to INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
  • Methods and systems for event modulated electron microscopy
    Patent number: 11848173
    Abstract: A method for measuring an electron signal or an electron induced signal may be provided. The method may include providing a threshold number of events or a threshold event rate for a pixel on a detector. The method may include collecting from the detector the threshold number of events or determining that the threshold event rate is achieved, wherein a signal at the detector is an electron signal or an electron induced signal from a sample. The method may include modulating an intensity of an electron source directed to the sample in response.
    Type: Grant
    Filed: January 31, 2023
    Date of Patent: December 19, 2023
    Assignees: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC., THE PROVOST, FELLOWS, FOUNDATION SCHOLARS, AND THE OTHER MEMBERS OF BOARD, OF THE COLLEGE OF THE HOLY AND UNDIVIDED TRINITY OF QUEEN ELIZABETH NEAR DUBLIN
    Inventors: Bryan Walter Reed, Lewys Jones
  • High framerate and high dynamic range electron microscopy
    Patent number: 11804359
    Abstract: Methods and systems for acquiring transmission electron microscope video data on a rolling-shutter detector at an enhanced frame rate and without temporal distortions are described. Also described are methods to enhance the dynamic range of image and diffraction data acquired using a transmission electron microscope. The disclosed methods and systems may also be applicable to photon detection and imaging systems.
    Type: Grant
    Filed: July 27, 2020
    Date of Patent: October 31, 2023
    Assignee: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
    Inventors: Ruth Bloom, Sang Tae Park, Bryan Reed, Daniel Masiel
  • Arbitrary electron dose waveforms for electron microscopy
    Patent number: 11728128
    Abstract: A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.
    Type: Grant
    Filed: May 26, 2022
    Date of Patent: August 15, 2023
    Assignee: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
    Inventors: Ruth Shewmon Bloom, Bryan Walter Reed, Daniel Joseph Masiel, Sang Tae Park
  • Arbitrary electron dose waveforms for electron microscopy
    Patent number: 11476082
    Abstract: A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.
    Type: Grant
    Filed: March 7, 2022
    Date of Patent: October 18, 2022
    Assignee: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
    Inventors: Ruth Shewmon Bloom, Bryan Walter Reed, Daniel Joseph Masiel, Sang Tae Park
  • Temporal compressive sensing systems
    Patent number: 10571675
    Abstract: Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: February 25, 2020
    Assignee: Integrated Dynamic Electron Solutions, Inc.
    Inventor: Bryan Reed
  • Temporal compressive sensing systems
    Patent number: 10018824
    Abstract: Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.
    Type: Grant
    Filed: November 3, 2017
    Date of Patent: July 10, 2018
    Assignee: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
    Inventor: Bryan W. Reed
  • Temporal compressive sensing systems
    Patent number: 9841592
    Abstract: Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.
    Type: Grant
    Filed: August 22, 2016
    Date of Patent: December 12, 2017
    Assignee: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
    Inventor: Bryan W. Reed