Abstract: A method for holding and orienting a wafer having an alignment feature, the method includes gripping a wafer with an end effector attached to an end of a robot arm, the end effector including a gripping mechanism which includes a first contacting member, a second contacting member, and a drive element, and wherein gripping includes increasing and decreasing the space between the first and second contacting members, the method also including rotating the wafer about an axis that is perpendicular to the plane of the wafer and sensing the alignment feature on the wafer as the gripping mechanism rotates the wafer.