Patents Assigned to Integrated Test Arizona
  • Patent number: 7795890
    Abstract: A reduced ground spring probe array and a method for controlling the impedance of the signal spring probes in the reduced ground spring probe array. Signal spring probes are positioned in a row-column format across the surface of the spring probe tower. Ground spring probes are positioned in a row/alternating-column format across the surface of the spring probe tower such that one ground probe is positioned between two or more signal probes. In doing so, a void space exists for every other ground probe column such that one or more signal lines may be routed within the void space or the array may be compressed to establish a smaller overall spring probe tower footprint.
    Type: Grant
    Filed: June 9, 2008
    Date of Patent: September 14, 2010
    Assignee: Integrated Test Arizona
    Inventors: Richard D. Carlsen, David Moore, Shawn Van Haren