Abstract: A method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object. The method and apparatus for measuring the three-dimensional surface shape of the object, in which a real-time measurement of the three-dimensional surface is performed by projecting a beam of light having color information onto the object and detecting color distribution information according to levels of the object, thereby obtaining level information of the object.
Type:
Grant
Filed:
October 31, 2001
Date of Patent:
August 15, 2006
Assignee:
Intek Plus Co., Ltd.
Inventors:
Ssang-Gun Lim, Gee-Hong Kim, Yi-Bae Choi, Sang-Yoon Lee
Abstract: An apparatus and method for measuring a three-dimensional shape of an object using a projection moiré device. The method comprises the steps of obtaining a grid pattern image projected on a reference plane of a moving table and applying a buckets algorithm thereto, thereby achieving a reference phase, obtaining a grid pattern image projected on the object set on the moving table and applying a buckets algorithm thereto, thereby achieving an object phase, calculating a difference phase between the object phase and the reference phase, thereby achieving a moiré phase, and unwrapping the moiré phase, thereby achieving a level information of the object. The apparatus and method measure the three-dimensional shape using a projection grid without a reference grid, thereby achieving compactness of equipment, simplicity in usage and manufacturing cost reduction.
Type:
Grant
Filed:
October 31, 2001
Date of Patent:
March 29, 2005
Assignee:
Intek Plus Co., Ltd.
Inventors:
Ssang-Gun Lim, Seung-Woo Kim, Sang-Yoon Lee, Chang-Jin Chung, Yi-Bae Choi, Young-Sik Cho, Kyung-Keun Park