Abstract: An integrated circuit is described that includes a stored program processor for test and debug of user-definable logic plus external interface between the test/debug circuits and the component pins. The external interface may be via an existing test interface or a separate serial or parallel port. Test and debug circuits may contain scan strings that may be used to observe states in user-definable logic or be used to provide pseudo-random bit sequences to user-definable logic. Test and debug circuits may also contain an on-chip logic analyzer for capturing sequences of logic states in user-definable circuits. Test and debug circuits may be designed to observe states in user-definable circuits during the normal system operation of said user-definable circuits.
Type:
Application
Filed:
March 27, 2015
Publication date:
January 14, 2016
Applicant:
INTELLECTUAL VENTURES LLC
Inventors:
Bulent DERVISOGLU, Laurence H. Cooke, Vacit Arat
Abstract: A nozzle discharge assembly includes a housing having a connection for receiving a pressurized supply of liquid and a nozzle having a discharge orifice movable relative to the housing. A mechanism controls a movement of the discharge orifice so that the discharge orifice moves in a pattern relative to the housing for creating a substantially helical stream of liquid when the pressurized supply of liquid flows through the discharge orifice.
Abstract: A method and apparatus for creating and rendering multiple-view images. A camera includes an image sensor to receive images, sampling logic to digitize the images and a processor programmed to combine the images based upon a spatial relationship between the images.