Abstract: A memory testing device uses a master control unit to concurrently operate multiple, intelligent, slave control units (SCUs). SCUs have one or more processing unit(s) (i.e. Finite State Machines, micro controllers, processors) capable of processing one or more firmware with or without operating system (i.e. bare-metal, embedded OS, RTOS (real time operating system)) to perform a series of task defined by firmware(s) for testing volatile and/or non-volatile memory devices connected into one or more DUT devices plus SCU has capability of having operating system and install and run host applications locally within each SCU units to mimic host applications environments along with performing regular memory testing.

Abstract: A tester board system that includes a frame upon which a plurality of motherboard assemblies can be inserted for the purposes of BI and other types of component testing. Each motherboard assembly has memory channels disposed on an upper motherboard that can accommodate a plurality of memory components for testing, and the memory channels are connected to a CPU. The CPU is disposed on a lower motherboard and the memory channels are connected to the CPU via communication connectors that are passed via a connection column between the upper and lower motherboards.

Abstract: A memory testing device uses a master control unit to concurrently operate multiple, intelligent, slave control units (SCUs). SCUs can have one or more processing unit(s) (i.e. Finite State Machines, micro controllers, processors) capable of testing volatile and/or non-volatile memory devices connected into one or more DUT devices. Additionally, SCUs can have an operating system that can install and run host applications locally within each SCU unit to mimic host applications environments, along with performing regular memory testing. SCUs can operate using software and/or firmware, or hardware without reliance on firmware or software.

Abstract: A system for dismantling defective BGA chips from double-sided PCBA having a fix stage and a cooling stage. The fix stage includes at least one shield that prevents hot air from a hot air gun to heat BGA chips that are adjacent to the defective BGA chips. The cooling stage prevents overheating of the BGA chips that are on the opposite side of the double-sided PCBA by conducting heat away from the BGA chips during the process.

Abstract: A memory testing device uses a master control unit (MCU) to concurrently operate multiple, intelligent, slave control units (SCUs). The MCU or an SCU translates memory addresses of a device under test (DUT) into a matrix. The SCU accumulates error data by testing a test bit of the memory across multiple cells of the matrix, the accumulated error data is post-processed to determine if the test bit is faulty, and the process is repeated for additional test bits. The post-processed data is analyzed to identify one or more of the test bits as faulty, and then include in a test log preferably only a single instance of a memory address that corresponds to each of the one or more faulty test bits.

Abstract: A memory testing device uses a master control unit to concurrently operate multiple, intelligent, slave control units (SCUs). SCUs have one or more processing unit(s) (i.e. Finite State Machines, micro controllers, processors) capable of processing one or more firmware with or without operating system (i.e. bare-metal, embedded OS, RTOS (real time operating system)) to perform a series of task defined by firmware(s) for testing volatile and/or non-volatile memory devices connected into one or more DUT devices plus SCU has capability of having operating system and install and run host applications locally within each SCU units to mimic host applications environments along with performing regular memory testing.

Abstract: Apparatus, systems, and methods for reducing memory product testing failures, including a memory tester that keeps track of how often a memory product is inserted into a memory product receiving component of the memory tester, and uses that information to trigger replacing the memory product receiving component when the count reaches or exceeds a threshold. The electronics can be arranged to increase the count even if a memory product is inserted into the memory product receiving component while the memory tester is powered off.

Abstract: A memory testing device uses a master control unit to concurrently operate multiple, intelligent, slave control units (SCUs). SCUs have one or more processing unit(s) (i.e. Finite State Machines, micro controllers, processors) capable of processing one or more firmware with or without operating system (i.e. bare-metal, embedded OS, RTOS (real time operating system)) to perform a series of task defined by firmware(s) for testing volatile and/or non-volatile memory devices connected into one or more DUT devices plus SCU has capability of having operating system and install and run host applications locally within each SCU units to mimic host applications environments along with performing regular memory testing.