Abstract: A configurable and modular probe device for electrical connections. The probe device has multiple blocks capable of inter-fitting into various layouts. Each block has four sidewalls. Two adjacent sidewalls have a protrusion and the respective opposite sidewalls have a cavity corresponding to the protrusion. The protrusion of one block can removably mate with the cavity of a neighboring block. Each block further has a central cavity extending from a top surface to a bottom surface of the block. A probe snugly fits into the central cavity.

Abstract: A connector includes a receptacle having a body defining apertures and having a mating face and socket contacts each defining an opening aligned with an aperture. The connector also includes a plug having an outer casing defining a cavity and having a mating end and contacts positioned within the cavity and coupled to the outer casing, each having a pin tip. The plug also includes a pin protection plate slidably coupled to the outer casing, enclosing at least a portion of each contact within the cavity, and defining pin guides each aligned with one of the contacts. When the mating end is aligned with the mating face and force is applied to the outer casing towards the body, the pin protection plate slides into the cavity and the pin tip of the contacts extends beyond the pin protection plate into a socket contact via one of the apertures.

Abstract: This disclosure provides for an electrical probe, which can include a shell extending along a longitudinal axis and defining an internal cavity with an opening at a first end, where the shell can include a neck portion defined by a hollow polygonal shaft twisted about the longitudinal axis to form an internal cam surface. The electrical probe can also include a plunger slidably received in the internal cavity. The plunger can include a tip configured to extend at least partially through the opening at the first end and a cam element integrally formed with the tip and having a cross-sectional shape substantially corresponding to a cross-sectional shape of the hollow polygonal shaft, such that, when the plunger is reciprocated along the longitudinal axis of the shell, the cam element can engage with the internal cam surface of the neck portion to cause rotation of the tip.

Abstract: This disclosure provides for an electrical probe, which can include a shell extending along a longitudinal axis and defining an internal cavity with an opening at a first end, where the shell can include a neck portion defined by a hollow polygonal shaft twisted about the longitudinal axis to form an internal cam surface. The electrical probe can also include a plunger slidably received in the internal cavity. The plunger can include a tip configured to extend at least partially through the opening at the first end and a cam element integrally formed with the tip and having a cross-sectional shape substantially corresponding to a cross-sectional shape of the hollow polygonal shaft, such that, when the plunger is reciprocated along the longitudinal axis of the shell, the cam element can engage with the internal cam surface of the neck portion to cause rotation of the tip.

Abstract: A configurable and modular probe device for electrical connections. The probe device has multiple blocks capable of inter-fitting into various layouts. Each block has four sidewalls. Two adjacent sidewalls have a protrusion and the respective opposite sidewalls have a cavity corresponding to the protrusion. The protrusion of one block can removably mate with the cavity of a neighboring block. Each block further has a central cavity extending from a top surface to a bottom surface of the block. A probe snugly fits into the central cavity.

Abstract: A socket for use in a test system is provided, where the test system is configured to align at least a portion of an electronic device with a plurality of aligned connectors. The socket can include a metal structure having a plurality of openings, the plurality of openings spaced to accommodate the plurality of aligned connectors. At least one opening in the plurality of openings can extend through a thickness of the metal structure and can have an annular inner surface. The annular inner surface can be proximal to at least a portion of a conductive outer surface of at least one aligned connector of the plurality of aligned connectors in the test system. The socket can further include an insulation layer provided on the annular inner surface.

Abstract: A contact probe and method of forming the same are provided, where the contact probe can include a shell including a body having a shell cavity. The contact probe can also include at least one plunger slidably received in the shell cavity and extending through at least one opening in at least one end of the shell. The contact probe can further include a biasing device configured to exert a biasing force on the at least one plunger and at least one insulation member including an insulative material. The at least one insulation member can be disposed on at least a portion of an outer surface of at least one of: the shell and the at least one plunger.

Abstract: A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved structure. The first portion and the second portion may be formed integrally, and the second portion may be configured to contact a portion of a device lead.

Abstract: An electrical connector and method of forming the same are provided, where the method can include affixing at least one layer to a core such that the layer is isomorphic to at least a portion of on an external surface of the core, press fitting the core with the layer into a socket cavity in a socket body, and removing the core from the socket cavity while leaving at least a portion of the layer so that the layer forms a shell layer affixed to an internal surface of the socket cavity. The method can further include inserting at least one plunger and a biasing device into a shell cavity so that a tail of the plunger is slidably received in the shell cavity and the biasing device biases a tip of the plunger away from an internal surface of the shell cavity.

Abstract: According to an example embodiment, a contact cell includes a first element that is flexible and electrically conductive, and that is structured to have at least one bend along an entire length of the first element. The contact cell further includes a second element that is flexible and electrically conductive, and that is structured to have at least one bend along an entire length of the second element. The contact cell further includes a tie that is electrically non-conductive, and that is affixed to the first element and affixed to the second element such that the first element and second element are physically and electrically separated from each other.

Abstract: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Abstract: A contact probe assembly may include a cylindrical member including a barrel having a first opening located at a first end of the barrel and a second opening located at a second end of the barrel. The contact probe assembly may also have a plunger having a first end and second end. The first end of the plunger may be adapted to be removably received by the second opening of the barrel. The contact probe assembly may also include a cap having at least one o-ring. The cap may be configured to interconnect with the second end of the barrel such that the o-ring seals a gap between the plunger and the barrel. The contact probe assembly may have a plug that may be adapted to be removably received by the first opening of the barrel. The plug may be configured to seal the first opening.

Abstract: An interconnect assembly electrically connecting two circuit members, which include respective arrays of electrical contacts for engagement with the interconnect assembly. The interconnect assembly comprises a plurality of electrical conductors, the plurality of conductors arranged in a spaced arrangement, the spaced arrangement of the conductors substantially corresponding to a spaced arrangement for the respective arrays of electrical contacts to provide contact between the conductors and the contact arrays and a carrier, including a socket and a retainer. The socket includes a plurality of apertures each receiving an upper portion of one of the plurality of conductors and the retainer includes a plurality of apertures each receiving a lower portion of one of the plurality of conductors; and the respective apertures are aligned axially with each other.

Abstract: A contact probe assembly may include a cylindrical member including a barrel having a first opening located at a first end of the barrel and a second opening located at a second end of the barrel. The contact probe assembly may also have a plunger having a first end and second end. The first end of the plunger may be adapted to be removably received by the second opening of the barrel. The contact probe assembly may also include a cap having at least one o-ring. The cap may be configured to interconnect with the second end of the barrel such that the o-ring seals a gap between the plunger and the barrel. The contact probe assembly may have a plug that may be adapted to be removably received by the first opening of the barrel. The plug may be configured to seal the first opening.

Abstract: A test socket comprises a test socket body with a central opening configured to receive a device under test (DUT) including at least one arm opening in the test socket body; and at least one rotating arm disposed in the arm opening.

Abstract: A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved structure. The first portion and the second portion may be formed integrally, and the second portion may be configured to contact a portion of a device lead.

Abstract: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Abstract: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Abstract: A probe array wafer includes a substrate upon which a plurality of compliant probes are mounted. Pairs of axially aligned probes may be electrically connected together to provide a pass through power connection from the test equipment to the device under test. Likewise, pairs of axially aligned probes may be electrically connected together to provide a ground connection from the test equipment to the device under test.

Abstract: A spring probe having a barrel, plunger, spring and contact ring is provided in which the contact ring provides electrical contact between the plunger and the barrel. Two or more contact rings may be provided to improve the pointing accuracy of the probe.