Patents Assigned to Interface Studies Corporation
  • Angle of incidence accuracy in ultrathin dielectric layer ellipsometry measurement
    Patent number: 6323947
    Abstract: Improvements in accuracy and sensitivity in mechanical-optical metrology apparatus are achieved through the use of a value for angle of incidence that is an average of positive and negative values for different arrangements of the metrology apparatus. In the ellipsometry type of metrology the average value for angle of incidence is established by using one of a reversal of light beam direction, the providing of a separate light beam mounting arm and the mechanical rotation of the sample.
    Type: Grant
    Filed: December 14, 1999
    Date of Patent: November 27, 2001
    Assignee: Interface Studies Corporation
    Inventor: John Lawrence Freeouf