Patents Assigned to International Faster Corporation
  • Patent number: 5764069
    Abstract: A test interface between an electrical circuit to be tested and a test controller generally includes a plurality of translation pins, a plurality of grid boards and a connector to a controller. Each translation pin has a first end disposed for electrical contact with a point to be tested on the circuit to be tested and has a second end; the second ends collectively forming an output grid. Each grid board includes a plurality of grid contacts printed on a peripheral receiving edge perpendicular to the boards faces. The plurality of grid boards are disposed such that the grid contacts form a receiving grid congruent with the output grid such that individual ones of the second ends of the translation pins make electrical contact with individual ones of the grid contacts.
    Type: Grant
    Filed: October 30, 1995
    Date of Patent: June 9, 1998
    Assignee: International Faster Corporation
    Inventor: Mario A. Cugini