Abstract: A method for real-time processing of a detection signal, wherein signal processing is respectively performed when a detection signal is converted from a high level to a low level or vice versa. A moment at which a level of the detection signal is converted is recorded as a start point. A status of the detection signal is then detected in real time at a current moment. A current time width is compared to a maximum interval width of pre-set interference signals, and signal levels are determined and recorded from the start point to the current moment. Using characteristics of different interference signals, anti-interference processing is performed by using a targeted edge positioning and width recognition method, so that the delay impact of filtering on signals is avoided, improving both the recognition precision of weighing data of a checkweigher and the overall performance of the checkweigher.
Abstract: A semiconductor device test system is disclosed. The semiconductor device test system extends driver- and comparator-functions acting as important functions of a test header to an external part (e.g., a HIFIX board) of the test header, such that it can double the productivity of a test without upgrading the test header. The semiconductor device test system includes a test header for testing a semiconductor device by a test controller, and a HIFIX board for establishing an electrical connection between the semiconductor device and the test header, and including a Device Under Test (DUT) test unit which processes a read signal generated from the semiconductor device by making one pair with a driver of the test header and transmits the processed read signal to the test header.
Type:
Grant
Filed:
October 17, 2008
Date of Patent:
May 21, 2013
Assignee:
International Trading & Technology Co., Ltd.
Inventors:
Kyung-hun Chang, Se-kyung Oh, Eung-sang Lee
Abstract: An apparatus for multiplying a semiconductor test pattern signal, which firstly encodes a plurality of pattern signals to have different pattern types, and multiplies the encoded pattern signals according to an exclusive-OR (XOR) scheme in order to generate a single pattern signal, thereby recognizing a relationship between a pattern signal before the multiplication and the other pattern signal after the multiplication. A pattern-signal segmenting/outputting unit segments a semiconductor test pattern signal into a plurality of pattern signals, and simultaneously outputs the segmented pattern signals.
Type:
Grant
Filed:
October 17, 2008
Date of Patent:
December 25, 2012
Assignee:
International Trading & Technology Co., Ltd.
Abstract: A semiconductor device test system is disclosed. The semiconductor device test system extends driver- and comparator-functions acting as important functions of a test header to an external part (e.g., a HIFIX board) of the test header, such that it can double the productivity of a test without upgrading the test header. The semiconductor device test system includes a test header for testing a semiconductor device by a test controller, and a HIFIX board for establishing an electrical connection between the semiconductor device and the test header, and including a Device Under Test (DUT) test unit which processes a read signal generated from the semiconductor device by making one pair with a driver of the test header and transmits the processed read signal to the test header.
Type:
Application
Filed:
October 17, 2008
Publication date:
January 27, 2011
Applicant:
INTERNATIONAL TRADING & TECHNOLOGY CO., LTD.
Inventors:
Kyung-hun Chang, Se-kyung Oh, Eung-sang Lee
Abstract: An apparatus for multiplying a semiconductor test pattern signal is disclosed. The multiplying apparatus firstly encodes a plurality of pattern signals to have different pattern types, and multiplies the encoded pattern signals according to an exclusive-OR (XOR) scheme in order to generate a single pattern signal, thereby recognizing a relationship between a pattern signal before the multiplication and the other pattern signal after the multiplication. A pattern-signal segmenting/outputting unit segments a semiconductor test pattern signal into a plurality of pattern signals, and simultaneously outputs the segmented pattern signals.
Type:
Application
Filed:
October 17, 2008
Publication date:
October 14, 2010
Applicant:
INTERNATIONAL TRADING & TECHNOLOGY CO., LTD.