Abstract: A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.

Abstract: In an electrically shielded connector, conductive material covers an outer surface of said body and is spaced away from a conductive structure included in the connector to create electrical isolation therebetween. A channel in which the connector is situated is either plugged when conductive material is applied to the connector during manufacturing or is counter bored to create the electrical isolation.

Abstract: An apparatus is used for coupling a test head to a mounting unit such as a cradle in which the test head pivots. A base is attachable to a test head. An extension member extends away from the test head. A slider slides away from and towards a center of gravity of the test head. The slider is attachable to the mounting unit. An adjustment member extends from the extension member for fixing the position of the slider relative to the base.

Abstract: A safety lock system prevents unlocking of a balanced loaded unit when the loaded unit becomes unbalanced. A plurality of calipers applies pressure on opposite sides of a guide rail. A lock block couples the load to at least one of the calipers for movement of the load along the guide rail. A rotatable handle is coupled to the calipers through a shaft. Rotation of the handle locks or unlocks the lock block against vertical movement. A safety block is coupled to the loaded unit and is moveable with the loaded unit for preventing rotation of the handle upon a preselected movement of the loaded unit relative to the lock block.

Abstract: A system is useful for positioning a load, such as a test head. The system includes an arm which supports the load and which moves along a first vertical axis. The system also includes a rotation unit for rotating the first vertical axis about a second vertical axis spaced apart from the first vertical axis.

Abstract: A bi-directional interface for transmitting signals between a circuit tester and a connection point proximate to a circuit to be tested includes a first and a second optical fiber link, a first directional gate for coupling both the input end of the first link and the output end of the second link to one endpoint of the interface and a second directional gate for coupling both the input end of the second link and the output end of the first link to the other endpoint of the interface. An optical fiber link for transmitting a signal between a circuit tester and a connection point proximate to a circuit to be tested includes an optical fiber for transmitting the signal, a light source electrically coupled to the link input and optically coupled to the input of the fiber, and a photodetector optically coupled to the fiber output and electrically coupled to the link output.

Abstract: An apparatus for coupling a test head and probe card in a wafer testing system incorporates a number of features that contribute to low impedance and reduced cross-talk, making the coupling apparatus particularly advantageous for high-speed test applications. The coupling apparatus may include, for example, an array of discrete conductor conduits that contain individual conducting elements. The conduits can be insulated, if desired, to reduce leakage. Further, the conduits can be made from metal, and terminated in dielectric interface plates for improved impedance matching. Divider elements can be provided to physically and electrically isolate adjacent rows of conductor conduits. Also, adjacent conducting elements can be connected to carry ground and signal potentials in an alternating manner such that signal carrying elements in a common row are separated from one another by ground carrying elements.