Patents Assigned to Invantest, Inc.
  • Method and system for detecting stuck components in automated test systems
    Patent number: 11268980
    Abstract: An inference engine determines whether a device under test has become stuck in a test socket of an automated test system by analyzing measurement data sampled during normal execution of a production test program for the device. The inference engine is trained to identify stuck patterns in the measurement data for a particular device design. In the event a stuck condition is detected by the inference engine, testing by the automated test system is halted and an alert is transmitted to an operator.
    Type: Grant
    Filed: May 20, 2021
    Date of Patent: March 8, 2022
    Assignee: Invantest, Inc.
    Inventors: Wen Jau Lee, Jason Saw
  • System, method, and computer program product for testing and re-testing integrated circuits
    Patent number: 8185337
    Abstract: A system, method, and computer program product are provided for testing and re-testing integrated circuits. In use, a group of integrated circuits is tested. In use, before finishing the test, at least one of the integrated circuits of the group is re-tested.
    Type: Grant
    Filed: October 11, 2010
    Date of Patent: May 22, 2012
    Assignee: Invantest, Inc.
    Inventors: Maxim Zverez, Paul Brandariz, Robert Easton, Jason Saw
  • System, method, and computer program product for testing and re-testing integrated circuits
    Patent number: 7835881
    Abstract: A system, method, and computer program product are provided for testing and re-testing integrated circuits. In use, a group of integrated circuits is tested. In use, before finishing the test, at least one of the integrated circuits of the group is re-tested.
    Type: Grant
    Filed: April 24, 2007
    Date of Patent: November 16, 2010
    Assignee: Invantest, Inc.
    Inventors: Maxim Zverev, Paul Brandariz, Robert Easton, Jason Saw