Patents Assigned to Ion Optics, Inc.
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Patent number: 7777887Abstract: An absorption spectroscopy apparatus including an elliptical mirror centered on the midpoint between a source/detector and a mirror. The cavity between the elliptical mirror and the source/bolometer and mirror defines an interior volume of a sample cell. Electromagnetic radiation from the source/detector travels along a multi-segment path starting from the source/bolometer toward the elliptical mirror, reflecting off of the elliptical mirror and traveling toward the mirror, reflecting off of the mirror and traveling back toward the elliptical mirror and finally reflecting off the elliptical mirror for a second time and returning toward the source/bolometer. The multiple reflections combined with the focusing effects of the elliptical mirrored surface result in an efficient sampling device. Among other aspects and advantages, the apparatus of the present disclosure is able to use incoherent, non-collimated light sources while maintaining high optical throughput efficiencies.Type: GrantFiled: April 11, 2008Date of Patent: August 17, 2010Assignee: Ion Optics, Inc.Inventors: Martin U. Pralle, Irina Puscasu, Peter Flowers
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Patent number: 7511274Abstract: A blackbody radiation device (110) includes a planar filament emission element (102) and a planar detector (104) for respectively producing and detecting radiation having width dl/l less than about 0.1 to test a sample gas, where l is the wavelength of the radiation; a reflector (108); a window (W); an electrical control (118); and a data output element (116).Type: GrantFiled: October 6, 2006Date of Patent: March 31, 2009Assignee: Ion Optics, Inc.Inventors: Edward A Johnson, James T. Daly, John S. Wollam, W. Andrew Bodkin
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Patent number: 7498574Abstract: An infrared emitter, which utilizes a photonic crystal (PC) structure to produce electromagnetic emissions with a narrow band of wavelengths, includes a semiconductor material layer, a dielectric material layer overlaying the semiconductor material layer, and a metallic material layer having an inner side overlaying the dielectric material layer. The semiconductor material layer is capable of being coupled to an energy source for introducing energy to the semiconductor material layer. An array of surface features are defined in the device in a periodic manner or quasi-periodic. The emitter device is adapted to emit electromagnetic energy having spectral characteristics determined by parameters of the periodically distributed surface features, the parameters including shape, size, depth, distribution geometry, periodicity, material properties and defects.Type: GrantFiled: July 8, 2005Date of Patent: March 3, 2009Assignee: Ion Optics, Inc.Inventors: Irina Puscasu, Martin U. Pralle, James T. Daly, Mark P. McNeal, Edward A. Johnson
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Patent number: 7280749Abstract: A radiation source including a base, a curved reflector attached to the base, pins passing through the base and within the reflector, and a filament of high emissivity material helically wound about the pins and having opposing ends electrically connected to the pins so that upon passage of electrical energy through the filament, the filament becomes electrically heated and emits infrared radiation.Type: GrantFiled: February 12, 2002Date of Patent: October 9, 2007Assignee: Ion Optics, Inc.Inventors: Peter G. Loges, James T. Daly, V. Mark Villafuerte, Christopher J. von Benken
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Patent number: 7215428Abstract: An absorption spectroscopy apparatus including a sample cell having a central axis, and a side wall coaxially positioned about the axis. The side wall defines a generally circular cross-section of the cell as taken along a plane extending perpendicular to the axis, wherein the generally circular cross-section of the sample cell has an average radius. The side wall includes a plurality of light reflective segments arrayed about the axis, wherein each reflective segment has a cross-section taken along a plane extending perpendicular to the axis of the cell that is concave with respect to the axis. The concave cross-section of each segment has an average radius that is unequal to the average radius of the generally circular cross-section of the sample cell. Among other aspects and advantages, the apparatus of the present disclosure is able to use incoherent, non-collimated light sources while maintaining high optical throughput efficiencies.Type: GrantFiled: April 8, 2005Date of Patent: May 8, 2007Assignee: Ion Optics, Inc.Inventors: Mark P. McNeal, Peter G. Loges, Irina Puscasu, James T. Daly, Edward A. Johnson
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Patent number: 7119337Abstract: A blackbody radiation device (110) includes a planar filament emission element (102) and a planar detector (104) for respectively producing and detecting radiation having width dl/1 less than about 0.1 to test a sample gas, where 1 is the wavelength of the radiation; a reflector (108); a window (W); an electrical control (118); and a data output element (116).Type: GrantFiled: July 30, 1999Date of Patent: October 10, 2006Assignee: Ion Optics, Inc.Inventors: Edward A. Johnson, John S. Wollam, James T. Daly
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Patent number: 6844553Abstract: An absorption spectroscopy apparatus having a fluid inlet and a fluid outlet. The apparatus includes a sample cell including an axis, a side wall having at least one curved reflective surface arrayed about the axis and facing inwardly with respect to the cell such that a beam of energy directed against a predetermined location on the reflective surface is reflected back and forth off the reflective surface and remains in substantially the same plane while inside the cell, and at least one port in the sidewall. The apparatus also includes at least one source/detector reflector having a curved profile in a plane extending perpendicular to the axis of the cell. The reflector is positioned with respect to the port of the cell to reflect energy through the port of the cell and against the predetermined location on the reflective surface of the side wall of the cell.Type: GrantFiled: February 22, 2002Date of Patent: January 18, 2005Assignee: Ion Optics, Inc.Inventors: James T. Daly, William Andrew Bodkin
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Patent number: 6528792Abstract: An apparatus for detecting a gas having distinct infrared radiation absorption characteristics. The apparatus includes a spectral source/bolometer for conducting an electrical current and for producing an infrared radiation. The source/bolometer is disposed along an axis and has a temperature and a characteristic resistance, and the characteristic resistance is a predetermined function of the temperature. A return reflector is disposed along the axis beyond the gas such that at least a portion of the infrared radiation passing through the gas is reflected back through the gas to the source/bolometer. The apparatus also includes a driver/detector for driving a current through the source/bolometer, for determining the characteristic resistance, and for detecting the gas from a variation of the characteristic resistance.Type: GrantFiled: April 16, 2002Date of Patent: March 4, 2003Assignee: Ion Optics, Inc.Inventors: Edward A. Johnson, William Andrew Bodkin
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Patent number: 6373056Abstract: An improved gas detector apparatus includes a spectral source/bolometer for conducting an electrical current and for producing infrared radiation. The source/bolometer has a characteristic resistance that is a predetermined function of the source/bolometer temperature. A concentrating reflector directs the infrared radiation through a spectral filter and the gas. A return reflector is disposed along the axis beyond the spectral filer and the gas, such that at least a portion of the infrared radiation passing through the filter and the gas is reflected back through the gas and the filter to the source/bolometer. A driver/detector drives a current through the source/bolometer, determines the characteristic resistance of the source/bolometer, and detects the gas from a variation of the characteristic resistance.Type: GrantFiled: February 1, 2001Date of Patent: April 16, 2002Assignee: Ion Optics, Inc.Inventors: Edward A. Johnson, William Andrew Bodkin
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Patent number: 6278809Abstract: A fiber optic reflectometer employs an optical fiber near a target substrate in a deposition chamber. The optical fiber is positioned within the chamber so that deposition of a thin film on the substrate also occurs on a portion of the optical fiber. A combination of monochromatic and broadband white light is transmitted through the optical fiber to the film deposited on it, and light reflectance measurements are made to determine, in situ and substantially in real time, such characteristics of the film as its growth rate, thickness, composition, surface roughness and refractive index. Such measurements can be made without bulk optics and without the precise alignment requirements of ellipsometry techniques and apparatus.Type: GrantFiled: May 29, 1998Date of Patent: August 21, 2001Assignees: Ion Optics, Inc., Brown University Research FoundationInventors: Edward A. Johnson, Theodore F. Morse
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Patent number: 6249005Abstract: An improved IR radiation source is provided by the invention. A radiation filament has a textured surface produced by seeded ion bombardment of a metal foil which is cut to a serpentine shape and mounted in a windowed housing. Specific ion bombardment texturing techniques tune the surface to maximize emissions in the desired wavelength range and to limit emissions outside that narrow range, particularly at longer wavelengths. A combination of filament surface texture, thickness, material, shape and power circuit feedback control produce wavelength controlled and efficient radiation at much lower power requirements than devices of the prior art.Type: GrantFiled: November 12, 1998Date of Patent: June 19, 2001Assignee: Ion Optics, Inc.Inventor: Edward A. Johnson