Abstract: A mass spectrometer for producing a primary beam of ions for bombarding a sample under vacuum. The mass spectrometer includes a detector for detecting a secondary beam of ions released from the sample. The primary beam of ions includes water clusters where each water cluster contains between 1 and 10,000 water molecules. The primary beam of ions, in one embodiment, is produced by adiabatic expansion of water vapor. An auxiliary beam of ions for bombarding the sample includes a different species to those of the primary beam of ions.
Type:
Grant
Filed:
April 30, 2014
Date of Patent:
September 29, 2015
Assignee:
Ionoptika Limited
Inventors:
Paul William Miles Blenkinsopp, Andrew Mark Barber
Abstract: An apparatus and method for the presentation of organic samples at low temperature and under vacuum for analysis using a surface analysis technique is described. The apparatus carries a sample trapped between two hinged plates which is subsequently cryogenically-cooled and then inserted into a vacuum system where it locates on a cold stage. The device has a mechanism which is used to fracture the sample whilst under vacuum and open the two halves of the sample ready for analysis. It thus provides a reliable automated method of freeze-fracture, replacing current unreliable manual methods.
Type:
Application
Filed:
April 18, 2008
Publication date:
July 1, 2010
Applicant:
Ionoptika Limited
Inventors:
Paul William Miles Blenkinsopp, Andrew Mark Barber