Patents Assigned to Ionoptika, Ltd.
  • Sample analyzer
    Patent number: 6002128
    Abstract: A time-of-flight secondary ion mass spectrometer instrument comprises a pulsed source of a beam of ions, directed through a focusing device onto a sample to be analyzed. Ions emitted from the sample are collected, and mass spectrometry performed thereon to analyze the sample. Both the source and emitted beams may be focused by the same focusing device. This allows the instrument to be mounted to a single port in a vacuum chamber.
    Type: Grant
    Filed: May 4, 1998
    Date of Patent: December 14, 1999
    Assignee: Ionoptika, Ltd.
    Inventors: Rowland Hill, Paul William Miles