Patents Assigned to Ionwerks, Inc.
  • Publication number: 20220404298
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Application
    Filed: June 29, 2022
    Publication date: December 22, 2022
    Applicant: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 11391681
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Grant
    Filed: December 21, 2020
    Date of Patent: July 19, 2022
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Publication number: 20210116402
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Application
    Filed: December 21, 2020
    Publication date: April 22, 2021
    Applicant: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 10876982
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Grant
    Filed: September 16, 2019
    Date of Patent: December 29, 2020
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Publication number: 20200013606
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Application
    Filed: September 16, 2019
    Publication date: January 9, 2020
    Applicant: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 10446383
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Grant
    Filed: April 11, 2017
    Date of Patent: October 15, 2019
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Publication number: 20170221691
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Application
    Filed: April 11, 2017
    Publication date: August 3, 2017
    Applicant: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 9297761
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Grant
    Filed: November 27, 2013
    Date of Patent: March 29, 2016
    Assignee: IONWERKS, INC.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 8829428
    Abstract: Described is an analytical method and apparatus for counting and measuring the flight time of secondary electrons, secondary ions and neutrals, scattered ions and/or neutrals and for correlating coincidences between these while maintaining a continuous un-pulsed, micro-focused, primary particle beam for impinging a surface for purposes of microprobe imaging and microanalysis.
    Type: Grant
    Filed: November 30, 2010
    Date of Patent: September 9, 2014
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Steven Ulrich, Kelley L. Waters
  • Publication number: 20140084153
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Application
    Filed: November 27, 2013
    Publication date: March 27, 2014
    Applicant: IONWERKS, INC.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 8614416
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Grant
    Filed: June 8, 2011
    Date of Patent: December 24, 2013
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 8558168
    Abstract: The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds.
    Type: Grant
    Filed: January 22, 2013
    Date of Patent: October 15, 2013
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Kelley L. Waters
  • Patent number: 8519329
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Grant
    Filed: December 16, 2011
    Date of Patent: August 27, 2013
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Steven R. Ulrich, Kelley L. Waters
  • Patent number: 8492710
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: September 17, 2010
    Date of Patent: July 23, 2013
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • Publication number: 20130134305
    Abstract: The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds.
    Type: Application
    Filed: January 22, 2013
    Publication date: May 30, 2013
    Applicant: Ionwerks, Inc.
    Inventor: Ionwerks, Inc.
  • Patent number: 8384023
    Abstract: The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds.
    Type: Grant
    Filed: January 23, 2010
    Date of Patent: February 26, 2013
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Kelley L. Waters, Ernest K. Lewis
  • Patent number: 8129675
    Abstract: The content of the invention comprises a concept of reactor for isolated ion transformations induced by collisions with neutral species. This reactor is also an interface between mobility cell and orthogonal injection TOFMS based on supersonic adiabatic gas flow with variable controlled composition directed along the axis of a multipole ion guide with sectioned rods for possibility of creating of controlled distributions of RF, DC and AC rotating fields.
    Type: Grant
    Filed: June 12, 2009
    Date of Patent: March 6, 2012
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Valeriy V. Raznikov, Thomas F. Egan, Michael V. Ugarov, Agnès Tempez, Marina O. Raznikova, Vladislav V. Zelenov, Alexander R. Pikhtelev, Valerie E. Vaughn
  • Patent number: 8115167
    Abstract: The content of the invention comprises a concept of multi-beam ion pre-selection from a single sample, coordinated mobility (against the gas flow) separation, cooling ions in supersonic gas flow and mass separation of thus low divergent ions by single or plural compact high-resolution orthogonal time-of-flight mass spectrometers both linear or reflectron type with controlled collision-induced dissociation (CID) and multi-channel data recording for the optimization of sample use in the analysis, and obtaining as much useful information about the sample as possible in a reasonably short time.
    Type: Grant
    Filed: December 18, 2008
    Date of Patent: February 14, 2012
    Assignee: Ionwerks, Inc.
    Inventors: Valeri V. Raznikov, J. Albert Schultz, Thomas F. Egan, Michael V. Ugarov, Agnès Tempez, Gennadiy Savenkov, Vladislav Zelenov
  • Publication number: 20120018630
    Abstract: Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
    Type: Application
    Filed: June 8, 2011
    Publication date: January 26, 2012
    Applicant: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Steven Ulrich, Kelley L. Waters
  • Patent number: 8101909
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Grant
    Filed: January 26, 2009
    Date of Patent: January 24, 2012
    Assignee: Ionwerks, Inc.
    Inventors: Thomas F. Egan, J. Albert Schultz, Steven R. Ulrich, Kelley L. Waters