Patents Assigned to Ionwerks
  • Patent number: 8101909
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Grant
    Filed: January 26, 2009
    Date of Patent: January 24, 2012
    Assignee: Ionwerks, Inc.
    Inventors: Thomas F. Egan, J. Albert Schultz, Steven R. Ulrich, Kelley L. Waters
  • Publication number: 20110147578
    Abstract: Described is an analytical method and apparatus for counting and measuring the flight time of secondary electrons, secondary ions and neutrals, scattered ions and/or neutrals and for correlating coincidences between these while maintaining a continuous un-pulsed, micro-focused, primary particle beam for impinging a surface for purposes of microprobe imaging and microanalysis.
    Type: Application
    Filed: November 30, 2010
    Publication date: June 23, 2011
    Applicant: IONWERKS, INC.
    Inventors: J. Albert Schultz, Thomas F. Egan, Steven Ulrich, Kelley L. Waters
  • Publication number: 20110049355
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Application
    Filed: September 17, 2010
    Publication date: March 3, 2011
    Applicant: IONWERKS, INC.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven Ulrich
  • Patent number: 7800054
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: September 21, 2010
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • Patent number: 7745780
    Abstract: A method and apparatus for multiplexed data acquisition for gas-phase ion mobility coupled with mass spectrometry is described. Ion packets are injected into an ion mobility drift chamber at a rate faster than the ion mobility separation arrival time distribution. The convoluted arrival time distributions thus generated are deconvoluted by a mass spectrometer and post-processing algorithms.
    Type: Grant
    Filed: May 19, 2008
    Date of Patent: June 29, 2010
    Assignees: Ionwerks, Inc., Texas A&M University System
    Inventors: John A. McLean, David H. Russell, Thomas F. Egan, Michael V. Ugarov, J. Albert Schultz
  • Publication number: 20100090101
    Abstract: The present invention enhances the laser desorption of biological molecular ions from surfaces by creating a surface localized MALDI particle matrix by ion implantation of low energy ionized clusters (gold, aluminum, etc.) or chemically derivatized clusters into the near surface region of the sample. MALDI analysis of the intact biomolecules on the surface or within a narrow subsurface region defined by the implantation range of the ions can then be performed by laser desorption into a mass spectrometer or, in a preferred embodiment, into a combined ion mobility orthogonal time of flight mass spectrometer.
    Type: Application
    Filed: December 4, 2009
    Publication date: April 15, 2010
    Applicant: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Michael V. Ugarov, Thomas F. Egan, Agnes Tempez, Yvon Le Bayec, Serge Della-Negra
  • Patent number: 7629576
    Abstract: The present invention enhances the laser desorption of biological molecular ions from surfaces by creating a surface localized MALDI particle matrix by ion implantation of low energy ionized clusters (gold, aluminum, etc.) or chemically derivatized clusters into the near surface region of the sample. MALDI analysis of the intact biomolecules on the surface or within a narrow subsurface region defined by the implantation range of the ions can then be performed by laser desorption into a mass spectrometer or, in a preferred embodiment, into a combined ion mobility orthogonal time of flight mass spectrometer.
    Type: Grant
    Filed: September 21, 2005
    Date of Patent: December 8, 2009
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Michael V. Ugarov, Thomas F. Egan, Agnes Tempez, Yvon Le Beyec, Serge D. Negra
  • Publication number: 20090189072
    Abstract: The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
    Type: Application
    Filed: January 26, 2009
    Publication date: July 30, 2009
    Applicant: Ionwerks, Inc.
    Inventors: Thomas F. Egan, J. Albert Schultz, Steven R. Ulrich, Kelley L. Waters
  • Patent number: 7547878
    Abstract: The content of the invention comprises a concept of reactor for isolated ion transformations induced by collisions with neutral species. This reactor is also an interface between mobility cell and orthogonal injection TOFMS based on supersonic adiabatic gas flow with variable controlled composition directed along the axis of a multipole ion guide with sectioned rods for possibility of creating of controlled distributions of RF, DC and AC rotating fields.
    Type: Grant
    Filed: June 29, 2007
    Date of Patent: June 16, 2009
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Valeriy V. Raznikov, Thomas F. Egan, Michael V. Ugarov, Agnès Tempez, Marina O. Raznikova, Vladislav V. Zelenov, Alexander R. Pikhtelev, Valerie E. Vaughn
  • Patent number: 7482582
    Abstract: The content of the invention comprises a concept of multi-beam ion pre-selection from a single sample, coordinated mobility (against the gas flow) separation, cooling ions in supersonic gas flow and mass separation of thus low divergent ions by single or plural compact high-resolution orthogonal time-of-flight mass spectrometers both linear or reflectron type with controlled collision-induced dissociation (CID) and multi-channel data recording for the optimization of sample use in the analysis, and obtaining as much useful information about the sample as possible in a reasonably short time.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: January 27, 2009
    Assignee: Ionwerks, Inc.
    Inventors: Valeri V. Raznikov, J. Albert Schultz, Thomas F. Egan, Michael V. Ugarov, Agnès Tempez, Gennadiy Savenkov, Vladislav Zelenov
  • Publication number: 20090008545
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Application
    Filed: April 25, 2008
    Publication date: January 8, 2009
    Applicant: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven R. Ulrich
  • Patent number: 7429729
    Abstract: The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, in improved ion mobility spectrometer (IMS), a multi-beam ion per-selection of the initial flow, and coordinated mobility and mass ion separation and detection using a single or several independent time-of-flight mass spectrometers for different beams with methods for fragmenting ion mobility-separated ions and multi-channel data recording.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: September 30, 2008
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Valeri V. Raznikov, Thomas F. Egan, Michael V. Ugarov, Agnès Tempez, Marina O. Raznikova, Valentin A. Tarasenko
  • Patent number: 7388197
    Abstract: A method and apparatus for multiplexed data acquisition for gas-phase ion mobility coupled with mass spectrometry is described. Ion packets are injected into an ion mobility drift chamber at a rate faster than the ion mobility separation arrival time distribution. The convoluted arrival time distributions thus generated are deconvoluted by a mass spectrometer and post-processing algorithms.
    Type: Grant
    Filed: July 27, 2005
    Date of Patent: June 17, 2008
    Assignee: Ionwerks, Inc.
    Inventors: John A. McLean, David H. Russell, Thomas F. Egan, Michael V. Ugarov, J. A. Schultz
  • Patent number: 7365313
    Abstract: Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.
    Type: Grant
    Filed: March 6, 2006
    Date of Patent: April 29, 2008
    Assignee: Ionwerks
    Inventors: Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz, Valerie E. Vaughn, Steven Ulrich
  • Patent number: 7291834
    Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: November 6, 2007
    Assignee: Ionwerks, Inc.
    Inventors: Marc Gonin, Valeri V. Raznikov, Katrin Fuhrer, J. Albert Schultz, Michael I. McCully
  • Patent number: 7223969
    Abstract: Improved ion focusing for an ion mobility drift cell allows for improved throughput for subsequent detection such as mass detection. Improved focusing is realized by the use of alternating regions of high and low electric fields in the ion mobility drift cell.
    Type: Grant
    Filed: January 30, 2006
    Date of Patent: May 29, 2007
    Assignee: Ionwerks, Inc.
    Inventors: J. Albert Schultz, Valeri Raznikov, Thomas F. Egan, Michael V. Ugarov, Agnès Tempez
  • Patent number: 7170052
    Abstract: An ion mobility/mass spectrometry method and instrument using aerosolized samples and dual positive and negative mode detection is described. Sample preparation methods are also described.
    Type: Grant
    Filed: December 29, 2004
    Date of Patent: January 30, 2007
    Assignees: Ionwerks, Inc., The Regents of the University of California
    Inventors: Hiroshi Furutani, Michael V. Ugarov, Kimberly Prather, J. Albert Schultz
  • Publication number: 20070018113
    Abstract: A detection scheme for time-of-flight mass spectrometers is described that extends the dynamic range of spectrometers that use counting techniques while avoiding the problems of crosstalk. It is well known that a multiple anode detector capable of detecting different fractions of the incoming particles may be used to increase the dynamic range of a TOFMS system. However, crosstalk between the anodes limits the amount by which the dynamic range may be increased. The present invention overcomes limitations imposed by crosstalk by using either a secondary amplification stage or by using different primary amplification stages.
    Type: Application
    Filed: September 1, 2006
    Publication date: January 25, 2007
    Applicant: Ionwerks, Inc.
    Inventors: Marc Gonin, Valeri Raznikov, Katrin Fuhrer, J. Schultz, Michael McCully
  • Patent number: 7164122
    Abstract: The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Use of a plurality of drift cells and a new RF field focusing interface are discussed.
    Type: Grant
    Filed: February 18, 2005
    Date of Patent: January 16, 2007
    Assignee: Ionwerks, Inc.
    Inventors: Katrin Fuhrer, Marc Gonin, J. Albert Schultz
  • Publication number: 20060289747
    Abstract: The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, an improved ion mobility spectrometer (IMS), a multi-beam ion pre-selection of the initial flow, and coordinated mobility and mass ion separation and detection using a single or several independent time-of-flight mass spectrometers for different beams with methods for fragmenting ion mobility-separated ions and multi-channel data recording
    Type: Application
    Filed: May 26, 2006
    Publication date: December 28, 2006
    Applicant: Ionwerks, Inc.
    Inventors: J. Schultz, Valeri Raznikov, Thomas Egan, Michael Ugarov, Agnes Tempez, Marina Raznikova, Valentin Tarasenko