Patents Assigned to IQLP, LLC
  • Publication number: 20190062520
    Abstract: A Front-Opening Unified Pod (FOUP), and more particularly an injection molded liquid crystal polymer article used in making the FOUP which both positive CTE value and shrinkage values and similar expansion and shrinkage of the article in both the MD and TD directions.
    Type: Application
    Filed: November 22, 2016
    Publication date: February 28, 2019
    Applicant: IQLP LLC
    Inventors: Michael A. Zimmerman, F. Michael Mahoney, William S. Scavuzzo
  • Patent number: 8728606
    Abstract: A circuit package for housing semiconductor or other integrated circuit devices (“die”) includes a high-copper flange, one or more high-copper leads and a liquid crystal polymer frame molded to the flange and the leads. The flange includes a dovetail-shaped groove or other frame retention feature that mechanically interlocks with the molded frame. During molding, a portion of the frame forms a key that freezes in or around the frame retention feature. The leads include one or more lead retention features to mechanically interlock with the frame. During molding, a portion of the frame freezes in or adjacent these lead retention features. The frame includes compounds to prevent moisture infiltration and match its coefficient of thermal expansion (CTE) to the CTE of the leads and flange. The is frame is formulated to withstand die-attach temperatures. A lid is ultrasonically welded to the frame after a die is attached to the flange.
    Type: Grant
    Filed: April 14, 2010
    Date of Patent: May 20, 2014
    Assignee: IQLP, LLC
    Inventor: Michael A. Zimmerman
  • Patent number: RE43807
    Abstract: A microcircuit package having a ductile layer between a copper flange and die attach. The ductile layer absorbs the stress between the flange and semiconductor device mounted on the flange, and can substantially reduce the stress applied to the semiconductor device. In addition, the package provides the combination of copper flange and polymeric dielectric with a TCE close to copper, which results in a low stress structure of improved reliability and conductivity.
    Type: Grant
    Filed: January 12, 2012
    Date of Patent: November 20, 2012
    Assignee: IQLP, LLC
    Inventors: Michael A. Zimmerman, Jonathan Harris