Abstract: There is provided a programmable receiver for detecting signals reflected from, or transmitted through, a material for analyzing flaws in the material, having a circuit for dividing the signals into a multiplicity of separate, independent sections for selective evaluation of waveform portions as contained in each of the sections. A method for detecting and analyzing flaws in materials is also provided.
Type:
Grant
Filed:
October 2, 1990
Date of Patent:
January 25, 1994
Assignee:
IRT Inspection Research & Technologies, Inc.
Inventors:
Abraham Aharoni, Tzach Livne, Itzhack Segev