Abstract: The present invention relates to the field of measuring apparatuses in distribution systems allowing for measuring presence, position and/or shape of an object placed on a carrier and a method for such measuring.

Abstract: System and sensor (10) for imaging characteristics of an object (2). The sensor comprises at least a first area (11) and a second area (12) of pixel elements arranged to absorb electromagnetic radiation from the object (2) and to convert the radiation absorbed into electrical charges. The first area (11) has a first degree of resolution and the second area (12) has a second degree of resolution different from the first degree of resolution and the first area (11) is arranged to image one type of characteristics and the second area (12) is arranged to image another type of characteristics.

Abstract: The present invention relates to a method and an arrangement for representing the characteristics of an object with a measuring system, in which either the measuring system or the object is designed to move in relation to one another in a predefined direction of movement. The object preferably is designed to move in relation to the measuring system. At least one light source is designed to illuminate the object with a light which is incident upon the object and has a limited extension in the direction of movement. An imaging sensor, which is arranged on the same side of the object as the light source is designed to pick up light reflected from the object and to convert this into electrical charges. An image-processing unit is furthermore designed to create a digital representation of the object from said electrical charges.

Abstract: The present invention relates to a device for the input and processing of information comprising sensor elements arranged in matrix form, which are integrally formed on a substrate. Each sensor element comprises output electronics (3) and at least one photovoltaic cell (PD), which is adapted to convert an optical signal incident upon the photovoltaic cell to an electrical signal. The device according to the invention is characterized in that each sensor element is adapted to perform compensation of an offset error in the output electronics (3) forming part of the sensor element and that each sensor element is adapted to perform the said offset compensation independently of the other sensor elements in the device.

Abstract: The present invention relates to a parallel processor containing a number of processor elements of the same type which are integrated on one and the same semiconductor chip. The processor is of the type that allows image and signal processing of the information stored in the processor element. The device contains a unit block (3) for each processor element and is characterized in that each unit block comprises at least two incrementing units (1a, 1b) which are designed to add a signal supplied to the unit block and a signal which originates from an incrementing unit corresponding to the respective unit in the closest preceding unit block in every direction of the processor element matrix. Every unit block (3) further contains at least one logical unit (2) which is designed to perform Boolean logic operations on the signals received from the incrementing units of the unit block.

Abstract: The invention relates to a method of executing image processing operations such as object recognition or linear/non-linear filtration on a two-dimensional image. This is performed with light-sensitive sensor elements (4) executed in two-dimensional matrix form. The sensor elements (4) are so arranged as to produce an output signal corresponding to the light intensity. The output signal of each sensor element is compared with a monotone increasing or reducing reference value. The extent to which the output signal from the sensor element is greater than or less than the reference value is continuously monitored for each sensor element. An arrangement for the execution of this method comprises a number of sensor elements (4) arranged on a substrate. Each of these has allocated to it on the substrate a comparator (5) so arranged as to compare the output signal of the sensor element with a pre-adjustable reference value and a sub-processor.