Patents Assigned to Izon Science Limited
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Patent number: 10429347Abstract: A method of determining a charge of at least one test particle (as herein defined), comprising: applying one of an electric current or a voltage across an aperture connecting two chambers, whereby the chambers are at least partially filled with electrolyte and whereby the at least one test particle is suspended in the electrolyte of at least one of the chambers; measuring a value indicative of the other of the electric current or voltage across the aperture; determining a time interval between a first and a second point in time, the second point in time corresponding to a point in time when the measured current or voltage has reached a specific proportion of the measured current or voltage at the first point in time; and determining the charge of the at least one test particle by: determining a value indicative of an electrical velocity component of a total velocity of at least one calibration particle having a known charge, taking into account that the total velocity of the at least one calibration particleType: GrantFiled: September 3, 2014Date of Patent: October 1, 2019Assignee: IZON SCIENCE LIMITEDInventors: Benjamin Mark Glossop, Robert Vogel, Eva Weatherall, Martin David Jones
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Patent number: 9664643Abstract: A method of determining the charge of at least one test particle, comprising: applying one of an electric current or a voltage across an aperture connecting two chambers, whereby the chambers are at least partially filled with electrolyte and whereby the at least one test particle is suspended in the electrolyte of at least one of the chambers; measuring the other of the electric current or voltage across the aperture; varying a pressure differential between the two chambers; and determining the charge based on the measurements of the electric current or voltage.Type: GrantFiled: August 2, 2012Date of Patent: May 30, 2017Assignee: IZON SCIENCE LIMITEDInventors: Johannes Adrianus Van Der Voorn, Robert Vogel, Benjamin Mark Glossop
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Patent number: 9052262Abstract: The flow of particles (18) in an aperture (10) between two reservoirs (14) and (15) is controlled by suspending the particles (18) in a fluid (17) within the aperture (10), applying a potential difference across the aperture (10) so as to tend to electrophoretically transport the particles (18) between a region of higher potential field and a region of lower potential in the fluid (17), applying a pressure differential across the aperture (10) so as to tend to transfer the fluid (17) with the particles (18) therein though the aperture (10) from a high-pressure reservoir (14) to a low-pressure reservoir (15), and adjusting the potential difference and/or the pressure differential across the aperture (10) in order to achieve precise control over the translation of the particles (18) within the aperture (10).Type: GrantFiled: January 26, 2011Date of Patent: June 9, 2015Assignee: IZON Science LimitedInventor: Johannes Adrianus Van Der Voorn
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Publication number: 20140251825Abstract: A method of determining the charge of at least one test particle, comprising: applying one of an electric current or a voltage across an aperture connecting two chambers, whereby the chambers are at least partially filled with electrolyte and whereby the at least one test particle is suspended in the electrolyte of at least one of the chambers; measuring the other of the electric current or voltage across the aperture; varying a pressure differential between the two chambers; and determining the charge based on the measurements of the electric current or voltage.Type: ApplicationFiled: August 2, 2012Publication date: September 11, 2014Applicant: IZON SCIENCE LIMITEDInventors: Johannes Adrianus Van Der Voorn, Robert Vogel, Benjamin Mark Glossop
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Publication number: 20130020200Abstract: A method is provided for detecting, measuring or controlling particles and/or electromagnetic radiation, comprising providing a deformable material containing a deformable aperture defining a path for particles or radiation, adjusting the deformable aperture to a prescribed geometry and/or size by deforming the deformable material to change at least one of the parameters of the path defined by the deformable aperture, and causing the particle or radiation to be detected, measured or controlled to enter the deformable aperture. The method includes the step of monitoring the geometry and/or size of the deformable aperture and controlling the adjustment of the size of the deformable aperture in response to such monitoring. The required apparatus is easily fabricated from inexpensive materials.Type: ApplicationFiled: July 27, 2012Publication date: January 24, 2013Applicant: IZON SCIENCE LIMITEDInventors: Stephen John SOWERBY, George Bouet PETERSEN, Murray Frederick BROOM, Martin David JONES
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Publication number: 20130015066Abstract: The flow of particles (18) in an aperture (10) between two reservoirs (14) and (15) is controlled by suspending the particles (18) in a fluid (17) within the aperture (10), applying a potential difference across the aperture (10) so as to tend to electrophoretically transport the particles (18) between a region of higher potential field and a region of lower potential in the fluid (17), applying a pressure differential across the aperture (10) so as to tend to transfer the fluid (17) with the particles (18) therein though the aperture (10) from a high-pressure reservoir (14) to a low-pressure reservoir (15), and adjusting the potential difference and/or the pressure differential across the aperture (10) in order to achieve precise control over the translation of the particles (18) within the aperture (10).Type: ApplicationFiled: January 26, 2011Publication date: January 17, 2013Applicant: IZON SCIENCE LIMITEDInventor: Johannes Adrianus Van Der Voorn
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Patent number: 8247214Abstract: A method is provided for detecting, measuring or controlling particles and/or electromagnetic radiation, comprising providing a deformable material containing a deformable aperture defining a path for particles or radiation, adjusting the deformable aperture to a prescribed geometry and/or size by deforming the deformable material to change at least one of the parameters of the path defined by the deformable aperture, and causing the particle or radiation to be detected, measured or controlled to enter the deformable aperture. The method includes the step of monitoring the geometry and/or size of the deformable aperture and controlling the adjustment of the size of the deformable aperture in response to such monitoring. The required apparatus is easily fabricated from inexpensive materials.Type: GrantFiled: July 13, 2005Date of Patent: August 21, 2012Assignee: Izon Science LimitedInventors: Stephen John Sowerby, George Bouet Petersen, Murray Frederick Broom, Martin David Jones