Abstract: Reflectometer, spectrophotometer, ellipsometer, and polarimeter systems having a supercontinuum laser source of coherent electromagnetic radiation over a range of about 400-about 2500 nm, a stage for supporting a sample and a detector of electromagnetic radiation, wherein the supercontinuum source provides a coherent beam of electromagnetic radiation which interacts with a sample, and the detector system comprises functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics, directs wavelengths in various ranges to various detectors that are well suited to detect them.
Type:
Grant
Filed:
September 20, 2016
Date of Patent:
November 20, 2018
Assignee:
J.A. WOOLAM CO., INC.
Inventors:
Jeremy A. Van Derslice, Martin M. Liphardt
Abstract: A method of applying a reflective optics system that requires the presence of both convex and a concave mirrors that have beam reflecting surfaces. Application thereof achieves focusing of a beam of electromagnetic radiation with minimized effects on a polarization state of an input beam state of polarization that results from adjustment of angles of incidence and reflections from the various mirrors involved.
Type:
Grant
Filed:
March 19, 2018
Date of Patent:
July 10, 2018
Assignee:
J.A. WOOLAM CO., INC.
Inventors:
Martin M. Liphardt, Jeffrey S. Hale, Ping He, Galen L Pfeiffer
Abstract: Methodology of characterizing pore size and distribution in a porous thin film having a surface, or in a surface region of a porous semi-infinite bulk substrate having a surface, involving applying a mathematical model of a sample based on a Bruggerman effective medium.
Type:
Grant
Filed:
May 22, 2017
Date of Patent:
May 22, 2018
Assignee:
J.A. WOOLAM CO., INC.
Inventors:
Stefan Schoeche, Jeremy A. Van Derslice, Jeffrey S. Hale, Craig M. Herzinger
Abstract: A combination of a focusing element, and a filtering element which naturally adjusts the cross-sectional area of a beam of electromagnetic radiation passed through the focusing element as a function of wavelength, optionally as an element of an ellipsometer or polarimeter system.
Abstract: Disclosed is a triangular shaped retarder system, for entering retardation between orthogonal components of an electromagnetic beam of radiation. The triangular shaped element, as viewed in side elevation, has first and second sides which project to the left and right and downward from an upper point. A third side is oriented essentially horizontally and is continuous with, and present below, the first and second sides. During use in a spectroscopic ellipsometer/polarimeter system, an entered beam of electromagnetic radiation exits in a propagation direction which is essentially undeviated and undisplaced from the direction of its incidence, even when the retarder system is caused to rotate about the locus of the beam of electromagnetic radiation.
Type:
Grant
Filed:
January 19, 1999
Date of Patent:
October 31, 2000
Assignee:
J. A. Woolam Co. INC
Inventors:
Blaine D. Johs, Craig M. Herzinger, Steven E. Green