Patents Assigned to Japan Electrical Safety & Environment Technology Laboratories
  • Patent number: 10418669
    Abstract: A method of propagation test on a battery system has: a main irradiation step of irradiating a laser beam in prescribed conditions, on a light-receiving part of the outer member of a light-receiving cell, or on a light-receiving part which is arranged in contact with the outer member of the light-receiving cell, thereby to heat the light-receiving cell; a thermal runaway confirming step of confirming a thermal runaway of the light-receiving cell; an irradiation stopping step of stopping the laser-beam irradiation after the thermal runaway was confirmed in the thermal runaway confirming step; and a system integrity inspection step of inspecting an integrity of the cells other than the light-receiving cell after the irradiation stopping step. The prescribed conditions are conditions in which a melted scar is formed on the light-receiving part.
    Type: Grant
    Filed: August 3, 2016
    Date of Patent: September 17, 2019
    Assignee: Japan Electrical Safety & Environment Technology Laboratories
    Inventors: Keizoh Honda, Hideki Tsuruga, Masachika Kodama, Takeshi Senoo, Kenji Nishioka, Hideo Ichimaru
  • Publication number: 20170059500
    Abstract: A method of propagation test on a battery system has: a main irradiation step of irradiating a laser beam in prescribed conditions, on a light-receiving part of the outer member of a light-receiving cell, or on a light-receiving part which is arranged in contact with the outer member of the light-receiving cell, thereby to heat the light-receiving cell; a thermal runaway confirming step of confirming a thermal runaway of the light-receiving cell; an irradiation stopping step of stopping the laser-beam irradiation after the thermal runaway was confirmed in the thermal runaway confirming step; and a system integrity inspection step of inspecting an integrity of the cells other than the light-receiving cell after the irradiation stopping step. The prescribed conditions are conditions in which a melted scar is formed on the light-receiving part.
    Type: Application
    Filed: August 3, 2016
    Publication date: March 2, 2017
    Applicant: Japan Electrical Safety & Environment Technology Laboratories
    Inventors: Keizoh HONDA, Hideki TSURUGA, Masachika KODAMA, Takeshi SENOO, Kenji NISHIOKA, Hideo ICHIMARU