Patents Assigned to Japan Science and Technology Institute
  • Patent number: 7508234
    Abstract: A technology for inspecting a write state without requiring a dedicated circuit for write state inspection of a local circuit in an ORGA. Upon switching an optical signal to be irradiated on an optically reconfigurable bit element as an inspection target from ON to OFF, in the logical circuit structure of the ORGA, first and second optical signal patterns having the optical signal ON/OFF to be irradiated to the optically reconfigurable bit element serving as optical signal patterns configuring the logical structure in which at least one logical level or output impedance changes are sequentially irradiated and input to the logical circuit. In addition, an output-state detection circuit that is connected to the logical output terminals and detects whether the logical level of the output terminal is at an H level, L level, or high impedance detects the output state.
    Type: Grant
    Filed: June 16, 2005
    Date of Patent: March 24, 2009
    Assignees: Japan Science and Technology Institute, Kyushu Institute of Technology
    Inventors: Minoru Watanabe, Fuminori Kobayashi