Patents Assigned to Japan Synchrotron Radiation Research Institute
  • Patent number: 10319578
    Abstract: A retarding potential type energy analyzer including a front grid electrode, reference grid electrode and rear grid electrode sequentially arranged, with a predetermined amount of potential difference given between the reference grid electrode and the front grid electrode to form an upward potential gradient as well as a potential difference given between the reference grid electrode and the rear grid electrode to form a downward potential gradient, the grid electrodes are arranged so that the distance between the reference grid electrode and the rear grid electrode is shorter than the distance between the reference grid electrode and the front grid electrode, or the potential difference between the reference grid electrode and the rear grid electrode is made to be greater than the potential difference between the reference grid electrode and the front grid electrode.
    Type: Grant
    Filed: January 21, 2016
    Date of Patent: June 11, 2019
    Assignee: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE
    Inventors: Takayuki Muro, Tomohiro Matsushita
  • Publication number: 20180082829
    Abstract: A retarding potential type energy analyzer including a front grid electrode, reference grid electrode and rear grid electrode sequentially arranged, with a predetermined amount of potential difference given between the reference grid electrode and the front grid electrode to form an upward potential gradient as well as a potential difference given between the reference grid electrode and the rear grid electrode to form a downward potential gradient, the grid electrodes are arranged so that the distance between the reference grid electrode and the rear grid electrode is shorter than the distance between the reference grid electrode and the front grid electrode, or the potential difference between the reference grid electrode and the rear grid electrode is made to be greater than the potential difference between the reference grid electrode and the front grid electrode.
    Type: Application
    Filed: January 21, 2016
    Publication date: March 22, 2018
    Applicant: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE
    Inventors: Takayuki MURO, Tomohiro MATSUSHITA
  • Publication number: 20120142116
    Abstract: An object of the present invention is to provide a co-crystal of a Ras polypeptide which adopts a conformation having a pocket on the molecular surface of Ras and GTP or a GTP analog, a production method for the crystal, and a screening method for a Ras function inhibitor based on information about the conformation obtained by X-ray crystallographic analysis using the crystal. The object is achieved by focusing on a mutation which adopts a conformation having a pocket on the molecular surface of Ras, acquiring a mutant Ras polypeptide having introduced therein such mutation, producing a co-crystal of the mutant Ras polypeptide and a GTP analog, and further subjecting the co-crystal to X-ray crystallographic analysis to acquire structural information about the conformation including information about the structure surrounding the pocket.
    Type: Application
    Filed: July 13, 2010
    Publication date: June 7, 2012
    Applicants: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE, NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
    Inventors: Tohru Kataoka, Fumi Shima, Atsuo Tamura, Takashi Kumasaka
  • Publication number: 20060032433
    Abstract: To characterize or evaluate ultra-fine structures such as ultra-fine nanowires grown on a substrate's crystal surface, buried ultra-fine nanolines or nanowires as sandwiched between a substrate's surface and an overlying cap layer, and thin-film crystals, or to solid-liquid interfacial structures comprising a solution and a solid, 0.1 nm or shorter-wavelength x-rays are incident on their surfaces at an angle of a few degrees or less and the diffracted x-rays are recorded with a two-dimensional x-ray detector in one action within a very short period of time, whereby the intensities of the diffracted x-rays from the ultra-fine structures or solid-liquid interfacial structures are visualized in the reciprocal lattice space and their structures are rapidly analyzed.
    Type: Application
    Filed: May 13, 2005
    Publication date: February 16, 2006
    Applicant: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE
    Inventor: Osami Sakata
  • Patent number: 6813338
    Abstract: High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.
    Type: Grant
    Filed: November 12, 2002
    Date of Patent: November 2, 2004
    Assignees: Japan Synchrotron Radiation Research Institute, Rigaku Corporation, Riken
    Inventors: Masaki Takata, Eiji Nishibori, Makoto Sakata, Jimpei Harada
  • Patent number: 6786393
    Abstract: A plurality of pinhole disks are superposed, fixed in position with the pinholes brought into alignment with the aid of a wire, a pin or light, and bonded or welded together to form a pinhole disk laminate. The laminate has an untapered deep enough center through-hole and is suitable as an order sorting aperture (OSA) in hard x-ray microscopy using a FZP.
    Type: Grant
    Filed: January 18, 2002
    Date of Patent: September 7, 2004
    Assignees: Japan Synchrotron Radiation Research Institute, National Institue of Advanced Industrial Science
    Inventors: Mitsuhiro Awaji, Nagao Kamijo, Shigeharu Tamura, Masato Yasumoto
  • Publication number: 20030091147
    Abstract: High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.
    Type: Application
    Filed: November 12, 2002
    Publication date: May 15, 2003
    Applicant: Japan Synchrotron Radiation Research Institute
    Inventors: Masaki Takata, Eiji Nishibori, Makoto Sakata, Jimpei Harada
  • Publication number: 20020104871
    Abstract: A plurality of pinhole disks are superposed, fixed in position with the pinholes brought into alignment with the aid of a wire, a pin or light, and bonded or welded together to form a pinhole disk laminate. The laminate has an untapered deep enough center through-hole and is suitable as an order sorting aperture (OSA) in hard x-ray microscopy using a FZP.
    Type: Application
    Filed: January 18, 2002
    Publication date: August 8, 2002
    Applicant: Japan Synchrotron Radiation Research Institute
    Inventors: Mitsuhiro Awaji, Nagao Kamijo, Shigeharu Tamura, Masato Yasumoto