Patents Assigned to Japan Synchrotron Radiation Research Institute
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Patent number: 10319578Abstract: A retarding potential type energy analyzer including a front grid electrode, reference grid electrode and rear grid electrode sequentially arranged, with a predetermined amount of potential difference given between the reference grid electrode and the front grid electrode to form an upward potential gradient as well as a potential difference given between the reference grid electrode and the rear grid electrode to form a downward potential gradient, the grid electrodes are arranged so that the distance between the reference grid electrode and the rear grid electrode is shorter than the distance between the reference grid electrode and the front grid electrode, or the potential difference between the reference grid electrode and the rear grid electrode is made to be greater than the potential difference between the reference grid electrode and the front grid electrode.Type: GrantFiled: January 21, 2016Date of Patent: June 11, 2019Assignee: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTEInventors: Takayuki Muro, Tomohiro Matsushita
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Publication number: 20180082829Abstract: A retarding potential type energy analyzer including a front grid electrode, reference grid electrode and rear grid electrode sequentially arranged, with a predetermined amount of potential difference given between the reference grid electrode and the front grid electrode to form an upward potential gradient as well as a potential difference given between the reference grid electrode and the rear grid electrode to form a downward potential gradient, the grid electrodes are arranged so that the distance between the reference grid electrode and the rear grid electrode is shorter than the distance between the reference grid electrode and the front grid electrode, or the potential difference between the reference grid electrode and the rear grid electrode is made to be greater than the potential difference between the reference grid electrode and the front grid electrode.Type: ApplicationFiled: January 21, 2016Publication date: March 22, 2018Applicant: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTEInventors: Takayuki MURO, Tomohiro MATSUSHITA
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Publication number: 20120142116Abstract: An object of the present invention is to provide a co-crystal of a Ras polypeptide which adopts a conformation having a pocket on the molecular surface of Ras and GTP or a GTP analog, a production method for the crystal, and a screening method for a Ras function inhibitor based on information about the conformation obtained by X-ray crystallographic analysis using the crystal. The object is achieved by focusing on a mutation which adopts a conformation having a pocket on the molecular surface of Ras, acquiring a mutant Ras polypeptide having introduced therein such mutation, producing a co-crystal of the mutant Ras polypeptide and a GTP analog, and further subjecting the co-crystal to X-ray crystallographic analysis to acquire structural information about the conformation including information about the structure surrounding the pocket.Type: ApplicationFiled: July 13, 2010Publication date: June 7, 2012Applicants: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE, NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITYInventors: Tohru Kataoka, Fumi Shima, Atsuo Tamura, Takashi Kumasaka
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Publication number: 20060032433Abstract: To characterize or evaluate ultra-fine structures such as ultra-fine nanowires grown on a substrate's crystal surface, buried ultra-fine nanolines or nanowires as sandwiched between a substrate's surface and an overlying cap layer, and thin-film crystals, or to solid-liquid interfacial structures comprising a solution and a solid, 0.1 nm or shorter-wavelength x-rays are incident on their surfaces at an angle of a few degrees or less and the diffracted x-rays are recorded with a two-dimensional x-ray detector in one action within a very short period of time, whereby the intensities of the diffracted x-rays from the ultra-fine structures or solid-liquid interfacial structures are visualized in the reciprocal lattice space and their structures are rapidly analyzed.Type: ApplicationFiled: May 13, 2005Publication date: February 16, 2006Applicant: JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTEInventor: Osami Sakata
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Patent number: 6813338Abstract: High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.Type: GrantFiled: November 12, 2002Date of Patent: November 2, 2004Assignees: Japan Synchrotron Radiation Research Institute, Rigaku Corporation, RikenInventors: Masaki Takata, Eiji Nishibori, Makoto Sakata, Jimpei Harada
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Patent number: 6786393Abstract: A plurality of pinhole disks are superposed, fixed in position with the pinholes brought into alignment with the aid of a wire, a pin or light, and bonded or welded together to form a pinhole disk laminate. The laminate has an untapered deep enough center through-hole and is suitable as an order sorting aperture (OSA) in hard x-ray microscopy using a FZP.Type: GrantFiled: January 18, 2002Date of Patent: September 7, 2004Assignees: Japan Synchrotron Radiation Research Institute, National Institue of Advanced Industrial ScienceInventors: Mitsuhiro Awaji, Nagao Kamijo, Shigeharu Tamura, Masato Yasumoto
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Publication number: 20030091147Abstract: High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.Type: ApplicationFiled: November 12, 2002Publication date: May 15, 2003Applicant: Japan Synchrotron Radiation Research InstituteInventors: Masaki Takata, Eiji Nishibori, Makoto Sakata, Jimpei Harada
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Publication number: 20020104871Abstract: A plurality of pinhole disks are superposed, fixed in position with the pinholes brought into alignment with the aid of a wire, a pin or light, and bonded or welded together to form a pinhole disk laminate. The laminate has an untapered deep enough center through-hole and is suitable as an order sorting aperture (OSA) in hard x-ray microscopy using a FZP.Type: ApplicationFiled: January 18, 2002Publication date: August 8, 2002Applicant: Japan Synchrotron Radiation Research InstituteInventors: Mitsuhiro Awaji, Nagao Kamijo, Shigeharu Tamura, Masato Yasumoto