Abstract: This invention discloses an optical and computation system that enables the magnitude of the retardation, or the birefringence, in a birefringent material to be measured. This is achieved by consideration of the spectral interference pattern generated by combining quadrature axes of polarized light that have passed through the material, however, unlike other approaches, this invention removes the spectral intensity variations of the light source and the spectral attenuation variations of the optical system before analyzing the resultant spectral interference pattern. Since the spectral interference pattern is unique for each retardation or birefringence value, this invention provides an absolute measure of these quantities.