Patents Assigned to JENOPTIK Industrial Metrology Germany GmbH
  • Publication number: 20240053144
    Abstract: An optical test device for testing flat test objects comprises a holder for the test object and two optical sensors for detecting the three-dimensional surface topography of the test object. According to the invention, the holder is formed at least in sections as a test standard and is disposed with respect to the sensors in such a way that the sensors scan the test object from opposite sides and also detect the holder as a test standard at least in sections during the detecting of the test object.
    Type: Application
    Filed: August 14, 2023
    Publication date: February 15, 2024
    Applicant: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Otto BOUCKY
  • Patent number: 11543228
    Abstract: A radial force device for a contour measuring instrument for measuring a contour of a shaft-shaped workpiece which can be rotated about an axis of rotation. The radial force device has a clamping body, a force introduction roller, at least one counter-roller and a coupling device. The clamping body is shaped for fitting radially around a workpiece portion, received in the contour measuring instrument, of the workpiece. The force introduction roller is designed to apply a mechanical radial force to the workpiece in order to apply a load to the workpiece, wherein the force introduction roller is mounted in a radially movable manner on the clamping body. The counter-roller is mounted in the clamping body and designed to support the workpiece during the application of the force. The coupling device is shaped for coupling the clamping body to the contour measuring instrument.
    Type: Grant
    Filed: October 13, 2021
    Date of Patent: January 3, 2023
    Assignee: Jenoptik Industrial Metrology Germany GmbH
    Inventors: Nils-Olaf Tomoscheit, Carsten Tuch
  • Patent number: 11454487
    Abstract: Surface measuring apparatus for measuring a surface of a workpiece has a probe for contacting the surface of workpiece, a feed apparatus for moving probe relative to surface of the workpiece along a feed axis for sampling surface of workpiece. The probe outputs a probe output signal during sampling of the workpiece. An evaluation apparatus is in data transmission connection with probe and is designed and programmed to reconstruct the profile of the surface of workpiece based on the probe output signal. Evaluation apparatus is designed and programmed to determine an apparatus frequency signature representing characteristic natural frequencies of the surface measuring apparatus, and an analyzer is provided which detects and analyzes the temporal course of the apparatus frequency signature, such that the functional state of the surface measuring apparatus is assessed based on the temporal course of the apparatus frequency signature.
    Type: Grant
    Filed: April 23, 2020
    Date of Patent: September 27, 2022
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Florian Schwarzer
  • Publication number: 20220120550
    Abstract: A radial force device for a contour measuring instrument for measuring a contour of a shaft-shaped workpiece which can be rotated about an axis of rotation. The radial force device has a clamping body, a force introduction roller, at least one counter-roller and a coupling device. The clamping body is shaped for fitting radially around a workpiece portion, received in the contour measuring instrument, of the workpiece. The force introduction roller is designed to apply a mechanical radial force to the workpiece in order to apply a load to the workpiece, wherein the force introduction roller is mounted in a radially movable manner on the clamping body. The counter-roller is mounted in the clamping body and designed to support the workpiece during the application of the force. The coupling device is shaped for coupling the clamping body to the contour measuring instrument.
    Type: Application
    Filed: October 13, 2021
    Publication date: April 21, 2022
    Applicant: JENOPTIK Industrial Metrology Germany GmbH
    Inventors: Nils-Olaf TOMOSCHEIT, Carsten TUCH
  • Patent number: 11255653
    Abstract: A method for operating a surface measuring apparatus for measuring a surface of a workpiece. Method includes operating surface measuring apparatus having a probe that includes a probe arm that is deflectable by an angle about a swivel axis, and that on its end facing away from the swivel axis bears a probe element. Probe is movable relative to a base body of surface measuring apparatus along a linear axis. In method, a workpiece is contacted by moving the probe along the linear axis by use of the probe element, and after workpiece is contacted, probe arm is moved by a specified travel distance along the linear axis. The resulting angular deflection of the probe arm about the swivel axis is measured, and based on the specified travel distance and measured angular deflection of the probe arm, the probe arm is classified with regard to its length.
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: February 22, 2022
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Adelbert Leber
  • Patent number: 10928177
    Abstract: Measuring apparatus for surface or contour measurement on a workpiece has a probe for contacting the surface of workpiece to be measured. Probe has a holding part to which a probe arm is detachably connectable or connected. Measuring apparatus also has a feed apparatus for moving probe relative to workpiece to be measured, and a control apparatus for controlling feed apparatus. A position sensor associated with probe arm and connected to control apparatus is provided, and which detects changes in the position of the probe arm, relative to holding part, from a measuring position into an interference position of probe arm, and generates a position change signal. Control apparatus is designed and programmed in such a way that, as a response to a position change signal, it generates a control signal for controlling feed apparatus in such a way that feed movement of probe is influenced.
    Type: Grant
    Filed: February 12, 2019
    Date of Patent: February 23, 2021
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventors: Philipp Steuer, Wolfgang Speck
  • Patent number: 10760891
    Abstract: Surface measuring apparatus for measuring a surface of a workpiece has a probe including a probe arm bearing a probe element for contacting workpiece surface to be measured. Surface measuring apparatus also has a feed apparatus for moving probe element relative to workpiece to be measured. Probe arm is detachably connectable or connected to a movable part of feed apparatus via a mechanical interface having a first part and a second part, which in installed position of probe arm are connected to one another with static determinacy on movable part of feed apparatus, and one of the parts is associated with probe arm and the other part is associated with feed apparatus. At least one alignment protrusion is on first part as an installation alignment aid, which in installed position of probe arm contactlessly or essentially contactlessly engages in an alignment recess formed on second part.
    Type: Grant
    Filed: March 27, 2018
    Date of Patent: September 1, 2020
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Philipp Steuer
  • Patent number: 10480965
    Abstract: Surface measuring device for measuring a surface of a workpiece has a device base body, and a measuring probe that by use of a feed apparatus is movable along a feed axis relative to a workpiece to be measured. The measuring probe has a probe base body and a probe element, connected to the probe base body, for scanning the workpiece in the direction of a measuring axis. The probe base body is connected to the measuring device base body via the feed apparatus. An oscillation damper is associated with the measuring probe, and is designed and configured for oscillation rate-dependent damping of oscillations of the probe base body of the measuring probe, and is active between the probe base body and the device base body.
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: November 19, 2019
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Raimund Volk
  • Patent number: 10408597
    Abstract: A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the second axis are parallel or approximately parallel to one another for radially contacting a surface of the workpiece. A device for rotating the measuring probe and the workpiece relative to one another is provided, such that the measuring probe contacts the surface of the workpiece during the rotation, and a device for plotting the angular deflection of the measuring probe as a function of the particular rotational position of the workpiece relative to the measuring probe is provided.
    Type: Grant
    Filed: April 12, 2017
    Date of Patent: September 10, 2019
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Raimund Volk
  • Patent number: 10330915
    Abstract: Borehole inspection device for inspecting a borehole in a workpiece has a measuring head which includes an endoscope and is insertable into the borehole to be inspected and movable relative to the borehole in different axial positions. Borehole inspection device has an imaging optics with a panoramic view for imaging the inner surface of the borehole, and the imaging optics is in image transmission connection with a digital image recorder. Device has a memory for storing the images recorded in different axial positions of the measuring head, and an evaluation apparatus for evaluating the images stored in the memory. In order to obtain surface depth information about the inner surface of the borehole, the evaluation apparatus is configured for evaluating images recorded at different viewing angles of the imaging optics with regard to the particular surface location, using a 3D reconstruction method.
    Type: Grant
    Filed: August 10, 2016
    Date of Patent: June 25, 2019
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Michael Rudolf
  • Patent number: 9983149
    Abstract: A testing device for testing an inner surface of a rotationally symmetrical cavity in a workpiece has a measuring head which defines an axial direction, and on which an optical system is situated. The optical system is in image transmission connection with an image recorder and a downstream evaluation apparatus. The testing device also has an illumination arrangement for illuminating an imaging area of the inner surface which is detected by the optical system. The illumination arrangement is designed and configured for illuminating the inner surface which is detected by the optical system. The illumination arrangement can illuminate the inner surface to be tested from different illumination directions in order to generate shadow images of the topography of the inner surface. The evaluation apparatus is designed and configured for determining the topography based on the shadow images recorded by the image recorder.
    Type: Grant
    Filed: September 30, 2015
    Date of Patent: May 29, 2018
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Michael Rudolf
  • Patent number: 9879969
    Abstract: A roundness and/or dimension measuring device for in-process measurement of crank pins during a machining operation on a grinding machine having a base body, and a measuring head, which is connected to the base body via a rod assembly and which is movable between a neutral position and a measuring position. The measuring head has a measuring probe for contacting the crank pin, and the rod assembly is designed and configured in such a way that the measuring head in the measuring position follows orbital rotations of the crank pin. At least one oscillation damping element is operatively associated with the measuring head for holding it in engagement with the crank pin during the orbital rotation.
    Type: Grant
    Filed: December 29, 2015
    Date of Patent: January 30, 2018
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Raimund Volk
  • Patent number: 9816811
    Abstract: Measuring device for measuring a rotationally symmetrical cavity in a workpiece has a base body for supporting on the workpiece, and a measuring head with a sensor for scanning the inner wall of the cavity. The measuring device has a shaft connected to the base body. Measuring head is movable relative to base body in the axial direction of the shaft and is rotatable about a rotational axis defined by the shaft. The shaft is configured as a hollow shaft, and accommodates a drive shaft rotationally drivable by a rotary drive apparatus. A distal end of the drive shaft is connected to the measuring head in a rotationally fixed manner. The shaft is situated on the base body and movable in the axial direction of the shaft by a slide bearing system. An axial drive apparatus moves the shaft relative to the base body.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: November 14, 2017
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Thomas Riester
  • Patent number: 9683914
    Abstract: A crank bearing face measuring device for measuring the faces of crank bearings of a crankshaft has a base body and a device for rotating the crankshaft about a main axis of rotation. The main axis of rotation is defined by the main bearings of the crankshaft. Measuring device also has a measuring head which has a probe prism for placing against a crank pin of the crankshaft, and at least one measuring probe, for placing against a face of the crank bearing to be measured. The measuring head is configured for and connected to the base body in such a way that the measuring head follows an orbital rotation of the crank pin during rotation of the crankshaft about the main axis of rotation.
    Type: Grant
    Filed: September 17, 2015
    Date of Patent: June 20, 2017
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventors: Guido Dietz, Michael Hauptmannl
  • Patent number: 9562756
    Abstract: A measuring device for in-process measurement of test pieces during a machining operation on a machine tool, in particular a grinding machine, has a base body, and a measuring head movable between a neutral position and a measuring position and which is connected to the base body via a rod assembly which is configured and set up in such a way that the measuring head in the measuring position follows orbital rotations of a test piece about a rotational axis. The measuring head has a measuring sensor which is deflectable along a linear axis for recording measured values during a measuring operation. A control apparatus is provided for controlling the measuring operation. The control apparatus is configured and set up in such a way that the measuring device may be calibrated in a calibration mode.
    Type: Grant
    Filed: September 20, 2013
    Date of Patent: February 7, 2017
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Jörg Seewig
  • Patent number: 9261359
    Abstract: A measuring head of a pneumatic measuring device for measuring a workpiece has a base element in which a first flow channel is provided for connecting a compressed air source to a measuring nozzle. The first flow channel has a constricted area with at least one cross-sectional constriction. The measuring head also has one or more second flow channels for connecting the constricted area to a measuring transducer. The base element has a divided configuration in the axial direction. The divided configuration may be provided at least in the constricted area of the first flow channel.
    Type: Grant
    Filed: March 6, 2013
    Date of Patent: February 16, 2016
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Francois DeCool
  • Patent number: 8964023
    Abstract: A device and a method for measuring form attributes, position attributes and dimension attributes of rotatable machine elements are described. It is the object of the invention to find a possibility for measuring form attributes, position attributes or dimension attributes of a rotatable machine element which also allows axially probeable surfaces having hidden regions to be measured with high accuracy with a lower expenditure on construction. According to the invention, this object is met in that a mechanical measuring unit having a tactile measuring probe for measuring the machine element in axial direction is provided in addition to an optical measuring unit with illumination module and camera module which captures a shadow image of the machine element. The mechanical measuring unit is fixed to the optical measuring unit and has a swiveling device for swiveling the tactile measuring probe orthogonal to the rotational axis of the machine element.
    Type: Grant
    Filed: May 2, 2013
    Date of Patent: February 24, 2015
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventors: Ernst Neumann, Michael Schubert
  • Publication number: 20140208877
    Abstract: A measuring head 2 for a measuring device, in particular a geometrical and dimensional measuring device, having a base body 4, which on the one hand can be connected to or is connected to the measuring device, and which on the other hand carries a probe body. An overload protection mean is provided, which in order to protect the measuring head or as the case may be the measuring device, from damage, is tripped in the event of an overload acting on the probe body. The overload protection means is inventively configured as an irreversible overload protection means 12, 14, 16, 18.
    Type: Application
    Filed: January 30, 2014
    Publication date: July 31, 2014
    Applicant: Jenoptik Industrial Metrology Germany GmbH
    Inventor: Wolfgang Speck
  • Publication number: 20130300861
    Abstract: A device and a method for measuring form attributes, position attributes and dimension attributes of rotatable machine elements are described. It is the object of the invention to find a possibility for measuring form attributes, position attributes or dimension attributes of a rotatable machine element which also allows axially probeable surfaces having hidden regions to be measured with high accuracy with a lower expenditure on construction. According to the invention, this object is met in that a mechanical measuring unit having a tactile measuring probe for measuring the machine element in axial direction is provided in addition to an optical measuring unit with illumination module and camera module which captures a shadow image of the machine element. The mechanical measuring unit is fixed to the optical measuring unit and has a swiveling device for swiveling the tactile measuring probe orthogonal to the rotational axis of the machine element.
    Type: Application
    Filed: May 2, 2013
    Publication date: November 14, 2013
    Applicant: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: JENOPTIK Industrial Metrology Germany GmbH