Patents Assigned to Jeol Limited
  • Patent number: 6373051
    Abstract: A positive ion of an isomer is generated in an ion source and introduced into a target chamber filled with a target alkali metal so that it is dissociated into a neutral fragment which is then subjected to charge inversion to generate a negative ion. By measuring the mass spectrum of the negative ion, the isomer can be detected at a higher resolution than has been possible by CID and other conventional mass spectroscopic techniques.
    Type: Grant
    Filed: February 16, 2000
    Date of Patent: April 16, 2002
    Assignees: Shigeo Hayakawa, Jeol Limited
    Inventors: Shigeo Hayakawa, Norio Morishita, Kazuo Arakawa