Patents Assigned to JEOL System Technology Co., Ltd.
  • Patent number: 7064326
    Abstract: An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
    Type: Grant
    Filed: June 24, 2004
    Date of Patent: June 20, 2006
    Assignees: JEOL Ltd., JEOL System Technology Co., Ltd.
    Inventors: Hiromitsu Furukawa, Miyoko Shimizu
  • Publication number: 20050029452
    Abstract: An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
    Type: Application
    Filed: June 24, 2004
    Publication date: February 10, 2005
    Applicants: JEOL Ltd., JEOL System Technology Co., Ltd.
    Inventors: Hiromitsu Furukawa, Miyoko Shimizu