Patents Assigned to JitterLabs LLC
  • Method and Apparatus for Analyzing Phase Noise in a Signal from an Electronic Device
    Publication number: 20230184828
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Application
    Filed: February 10, 2023
    Publication date: June 15, 2023
    Applicant: JitterLabs LLC
    Inventor: Gary Giust
  • Method and apparatus for analyzing phase noise in a signal from an electronic device
    Patent number: 11592480
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Grant
    Filed: December 27, 2021
    Date of Patent: February 28, 2023
    Assignee: JitterLabs LLC
    Inventor: Gary Giust
  • Method and Apparatus for Analyzing Phase Noise in a Signal From an Electronic Device
    Publication number: 20220120810
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Application
    Filed: December 27, 2021
    Publication date: April 21, 2022
    Applicant: JitterLabs LLC
    Inventor: Gary Giust
  • Method and apparatus for analyzing phase noise in a signal from an electronic device
    Patent number: 11231459
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Grant
    Filed: October 6, 2020
    Date of Patent: January 25, 2022
    Assignee: JitterLabs LLC
    Inventor: Gary Giust
  • Method and Apparatus for Analyzing Phase Noise in a Signal From an Electronic Device
    Publication number: 20210033670
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Application
    Filed: October 6, 2020
    Publication date: February 4, 2021
    Applicant: JitterLabs LLC
    Inventor: Gary Giust
  • Method and apparatus for analyzing phase noise in a signal from an electronic device
    Patent number: 10802074
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Grant
    Filed: December 5, 2018
    Date of Patent: October 13, 2020
    Assignee: JITTERLABS LLC
    Inventor: Gary Giust
  • Method and Apparatus for Analyzing Phase Noise in a Signal From an Electronic Device
    Publication number: 20190204386
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Application
    Filed: December 5, 2018
    Publication date: July 4, 2019
    Applicant: JitterLabs LLC
    Inventor: Gary Giust