Patents Assigned to Johannes Heidenhein GmbH
  • Patent number: 6885457
    Abstract: A rotary position measuring system having a housing connected with a scanning unit having a light source that emits beams of light and a detector element. A reflection scanning graduation structure arranged directly on the housing opposite the scanning unit. A graduated disk is connected with a rotatable shaft and has a radial transmission measuring graduation structure, wherein the graduated disk is arranged so it is rotatable around an axis of symmetry in the housing so that the measuring graduation structure is located between the scanning unit and the scanning graduation structure. The beams of light emitted by the light source first reach the measuring graduation structure where they are split into a first set of diffracted partial beams of different orders and the diffracted partial beams impinge on the scanning graduation structure.
    Type: Grant
    Filed: July 30, 1999
    Date of Patent: April 26, 2005
    Assignee: Dr. Johannes Heidenhein GmbH
    Inventors: Dieter Michel, Wolfgang Holzapfel
  • Patent number: 6799378
    Abstract: A stylus having a stem covered, at least partially, with a coating formed of an elastically or plastically deformable synthetic material.
    Type: Grant
    Filed: January 16, 2002
    Date of Patent: October 5, 2004
    Assignee: Johannes Heidenhein GmbH
    Inventors: Reinhold Schopf, Roland Fischer
  • Patent number: 6545262
    Abstract: A position measuring system for determining the relative position of a first object and a second object movable relative to one another that includes an incremental track, associated with a first object and having a periodic line structure that has individual lines and a scanning unit, associated with a second object movable relative to the first object, that scans said periodic line structure and that generates a corresponding incremental signal. A sensor system that generates absolute position information pertaining to the relative position of the first and second objects, wherein the width of the individual lines, as measured along a longitudinal direction of the incremental track, varies over at least a portion of the breadth of the incremental track, as measured in a direction transverse to the longitudinal direction, in such a way that a structure with absolute position information is superimposed on the periodic line structure.
    Type: Grant
    Filed: June 2, 2000
    Date of Patent: April 8, 2003
    Assignee: Dr. Johannes Heidenhein GmbH
    Inventor: Reiner Burgschat