Abstract: P channel EEPROM cells are designed for integration into arrays written with single polarity signals developed from small, low power charge pumps. These cells reduce the additional masking steps that must be added to a CMOS logic process for EEPROM to only one additional step. The novel cells of this invention enable the array to function with a V.sub.PP about 2 V less than that required by an N channel EEPROM cell, with similar writing speed and tunnel oxide thickness.
Abstract: A flash EPROM cell may be erased by placing a negative voltage on the control gate of a flash EPROM cell having spaced apart source and drain regions in a semiconductor substrate, and having a floating gate, a control gate and a sidewall gate, while biasing the drain at a positive voltage.