Abstract: A particle analysis system has an optical imaging device, e.g., a reflecting light stereomicroscope, that images a particle accumulation onto a substantially planar substrate. An illuminating device that includes a ring light on a lens barrel of the stereomicroscope illuminates at least part of the particle accumulation. The system includes a polarization device with an optical polarizer and an optical analyzer, and a positioning device displacing an illuminated measurement area of the particle accumulation grid by grid. An evaluating device with an electrical adjusting device obtains and evaluates imaging data on each measurement area. The optical polarizer and the optical analyzer are adjustable using the electrical adjusting device relative to each other in two polarizer positions. The imaging device generates imaging data of the particle accumulation with the polarizer positions in a software-controlled manner on each measurement area.

Abstract: In a known method for particle analysis, at least part of a particle accumulation is illuminated on a substantially planar substrate and imaged, a measurement area of the particle accumulation being displaced grid by grid, and imaging data obtained on the measurement area being evaluated with respect to particle characteristics.