Patents Assigned to Kabushiki Naisha Nihon Micronics
  • Patent number: 7728608
    Abstract: A method for assembling an electrical connecting apparatus having a support member, a probe board, and spacers arranged between the support member and the probe board. A height of at least either each abutting part of the support member or each abutting part of the probe board facing the abutting part is measured, and a length of each of the plurality of spacers is measured. Based on measurement values obtained by these measurements, a spacer appropriate for maintaining tips of numerous probes provided on the probe board on the same plane is selected for each pair of the both abutting parts.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: June 1, 2010
    Assignee: Kabushiki Naisha Nihon Micronics
    Inventor: Yoshiei Hasegawa