Patents Assigned to Kanai School, Inc.
  • Apparatus for measuring particulate size without contacting the particulate
    Patent number: 5327217
    Abstract: An apparatus is described for measuring the size of a particulate, without contacting the particulate, and therefore without extra forces on the particulate. Stripped gaps of interference fringes are measured behind the particulate when a monochromatic beam is radiated on the particulate.
    Type: Grant
    Filed: June 21, 1993
    Date of Patent: July 5, 1994
    Assignee: Kanai School, Inc.
    Inventors: Kenzo Kanai, Hiroshi Ito, Norikane Kanai