Abstract: When used as a test data generator, CDR internal structures may be applied to generate drift conditions in the test data. For example, a finite state machine phase shifts a clock signal, over time, driving the test data generator thereby producing a drift condition on the test data. Once the test is completed, one of the other CDRs may be used as a tester to similarly generate test data for the first CDR. CDRs may be configured in pairs for this purpose so that one may be used to test the other.

Abstract: A clock and data recovery device (CDR) based on multi-rate multi-phase oversampling technique is capable of receiving serial data streams of different data rates. The CDR uses a multi-rate multi-phase oversampling technique. N phase shifted clocks are generated based on a single clock and rising edges (or falling) of the phase shifted clocks and define N sampling points where a serial data stream is sampled. The multi-phase oversampling technique provides at least two sampling points per data bit of the serial data stream at highest data rates. The sampling points divide one clock cycle of the single clock into N zones. Depending on which of the zones a data edge transition is detected, the CDR can converge the sampling points to optimal data sampling positions in the serial data stream.

Abstract: A clock and data recovery device (CDR) based on multi-rate multi-phase oversampling technique is capable of receiving serial data streams of different data rates. The CDR uses a multi-rate multi-phase oversampling technique. N phase shifted clocks are generated based on a single clock and rising edges (or falling) of the phase shifted clocks and define N sampling points where a serial data stream is sampled. The multi-phase oversampling technique provides at least two sampling points per data bit of the serial data stream at highest data rates. The sampling points divide one clock cycle of the single clock into N zones. Depending on which of the zones a data edge transition is detected, the CDR can converge the sampling points to optimal data sampling positions in the serial data stream.

Abstract: When used as a test data generator, CDR internal structures may be applied to generate drift conditions in the test data. For example, a finite state machine phase shifts a clock signal, over time, driving the test data generator thereby producing a drift condition on the test data. Once the test is completed, one of the other CDRs may be used as a tester to similarly generate test data for the first CDR. CDRs may be configured in pairs for this purpose so that one may be used to test the other.

Abstract: A protocol translation cable assembly includes a first connector having a first plurality of pins, a second connector having a second plurality of pins, and an electrical cable coupling the first connector to the second connector, where the electrical cable includes a plurality of conductors. The protocol translation cable assembly further includes translation circuitry coupled to at least some of the plurality of wires of the electric cable at points between the first plurality of pins of the first connector and the second plurality of pins of the second connector. The translation circuitry preferably derives its power from the electrical cable such that separate power supplies are not required. The cable assembly therefore provides transparent "plug-and-play" capabilities.