Patents Assigned to Kayser-Threde GmbH
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Patent number: 6777880Abstract: A process for manipulating particles distributed substantially non-uniformly in a plasma of a carrier or reaction gas, wherein Coulomb interaction between the particles is so low that the particles substantially do not form a plasmacrystalline state, and the particles are exposed in a location-selective manner to external adjustment forces and/or the plasma conditions are subjected to a location-selective change to apply at least a portion of the particles onto a substrate surface mask-free and/or subject it to a location-selective plasma treatment in the carrier or reaction gas.Type: GrantFiled: March 31, 2003Date of Patent: August 17, 2004Assignees: Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V., Kayser-Threde GmbHInventors: Gregor Morfill, Hubertus Thomas, Timo Stuffler, Uwe Konopka
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Publication number: 20030185983Abstract: A process for manipulating particles distributed substantially non-uniformly in a plasma of a carrier or reaction gas, wherein Coulomb interaction between the particles is so low that the particles substantially do not form a plasmacrystalline state, and the particles are exposed in a location-selective manner to external adjustment forces and/or the plasma conditions are subjected to a location-selective change to apply at least a portion of the particles onto a substrate surface mask-free and/or subject it to a location-selective plasma treatment in the carrier or reaction gas.Type: ApplicationFiled: March 31, 2003Publication date: October 2, 2003Applicants: Max-Planck-Gesellschaft zur Forderung der Wissenschaften e. V., Kayser-Threde GmbHInventors: Gregor Morfill, Thomas Hubertus, Timo Stuffler, Uwe Konopka
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Patent number: 6517912Abstract: In a method for manipulating particles arranged in a plasma-cristalline state in a plasma of a carrier gas, the particles are at least partially subject to plasma treatment and/or applied to a substrate surface. A device for manipulating of particles in plasma-cristalline state includes a reaction vessel, in which plasma electrodes and at least one substrate are situated. An adaptive electrode for formation of a location selective low frequency or static electrical field in the reaction vessel is described.Type: GrantFiled: November 29, 1999Date of Patent: February 11, 2003Assignees: Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V., Kayser-Threde GmbHInventors: Gregor Morfill, Hubertus Thomas, Timo Stuffler, Uwe Konopka
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Patent number: 5241177Abstract: The invention relates to the field of analytical measuring technology and can be used for the detection of harmful substances in the atmosphere, for the process control of chemical gas phase reactions and for analyzing burnt off products, for example in laser surgery. The determination of the concentration of the substance to be detected ensues from the change in the modulation depth of the intensity of the irradiation of a laser operating according to the longitudinal two-mode-operation upon passage thereof through the gaseous medium to be analyzed.Type: GrantFiled: February 14, 1992Date of Patent: August 31, 1993Assignee: Erwin Kayser-Threde GmbHInventor: Hannes Albrecht
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Patent number: 5066990Abstract: A reflector system for Michelson interferometers comprises: a beam splitter arranged in the measurement ray path, which splits the measurement beam path into two split ray paths; a first mirror arrangement in each split ray path reflecting parallel to the incident ray; and at least one second mirror reflecting parallel to the incident ray, which is arranged in the ray path reflected from one of the first mirror arrangements and is coupled to the beam splitter, a partially transparent reflector serving as beam splitter, and the beam splitter and second mirror being arranged on a common carrier.Type: GrantFiled: November 16, 1989Date of Patent: November 19, 1991Assignee: Erwin Kayser - Threde GmbHInventor: Harald Rippel
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Patent number: 4732482Abstract: To reduce the data rate of a digitalized measuring signal produced in Fourier spectroscopy, the analog signal representing the interferogram is mixed with a second electrical signal whose frequency is modulated in proportion to the deviation of the instantaneous actual speed of the moving mirror of a double beam interferometer from its constant desired speed. Only the difference frequencies produced as a result of the frequency mixing are digitalized and supplied to an associated computer for analysis of the interferogram. The digital measuring signal thus obtained is distinguished by a substantially reduced data rate without giving rise to additional errors in the frequency transformation. To produce the second frequency modulated electrical signal, a laser source is used which supplies a laser beam into the interferometer parallel to the measuring beam.Type: GrantFiled: November 26, 1986Date of Patent: March 22, 1988Assignee: Kayser-Threde GmbHInventor: Harald Rippel
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Patent number: 4383762Abstract: A two-beam interferometer for Fourier spectroscopy includes a rigid pendulum structure mounting at least one of the movable retroreflectors in a fully compensated optical system immune to tilt and lateral movement distortions. The swing of the rotatably journaled pendulum accurately confines the retroreflector(s) to movement in a single plane during scanning and, due to the low heat generated in the pendulum bearings, the simple and compact structure is well adapted to be housed in a cryostat aboard a spacecraft.Type: GrantFiled: February 10, 1981Date of Patent: May 17, 1983Assignee: Kayser-Threde GmbHInventor: Peter Burkert