Patents Assigned to Kazuo Ohba
  • Patent number: 5378507
    Abstract: A continuous dry coating method and an apparatus therefor which are capable of removing cut chips and burrs from and smoothing inner walls of small-diameter holes in a substrate material and, then, successively performing a cold coating on these small holes in a short period of time. The continuous dry process coating method comprises the steps of: arranging electrodes on opposite sides of a substrate material; performing a plasma discharge to surface-treat small holes made in the substrate material; and then performing an electron cyclotron resonance plasma (ECR plasma) coating on the surfaces of these holes.
    Type: Grant
    Filed: June 4, 1993
    Date of Patent: January 3, 1995
    Assignees: Sakae Electronics Industrial Co., Ltd., Kazuo Ohba, Yoshinori Shima, Akira Ohba
    Inventors: Kazuo Ohba, Yoshinori Shima, Akira Ohba
  • Patent number: 5370779
    Abstract: A plasma process utilizing an electron cyclotron resonance (ECR) phenomenon caused by generating a magnetic field either parallel or perpendicular to, or both parallel and perpendicular to, a microwave propagation direction, characterized in that an ion beam is made to converge by applying a pulse voltage to a rotating magnetic field, a pulse voltage is applied to deflection plates, and an accelerating pulse voltage is further applied to a plasma.
    Type: Grant
    Filed: September 24, 1993
    Date of Patent: December 6, 1994
    Assignees: Sakae Electronics Industrial Co., Ltd., Kazuo Ohba, Yoshinori Shima, Akira Ohba
    Inventors: Kazuo Ohba, Yoshinori Shima, Akira Ohba
  • Patent number: 5322985
    Abstract: A method for boring small holes in a substrate by disposing electrodes on both sides of a substrate to be machined and applying a voltage between the electrodes so as to perform plasma discharge treatment at a pressure of 10 to 2.times.10.sup.3 Torrs. In another method, the gap of the two electrodes is set to 0.01 to 50 mm and a peak voltage to 10 V to 50,000 V in accordance with the electrode gap within the range of .tau..sub.ON the voltage waveform of 5 .mu.s to 20 seconds. The methods make it possible to quickly and reliably accomplish removal of chips causing clogging, smoothing of the inner walls of the holes and removal of fins in the holes.
    Type: Grant
    Filed: April 2, 1993
    Date of Patent: June 21, 1994
    Assignees: Sakae Electronics Industrial Co., Ltd., Kazuo Ohba, Kaori Shima, Akira Ohba
    Inventors: Kazuo Ohba, Kaori Shima, Akira Ohba