Abstract: A power envelope controller configured for use with an amplification stage and method are disclosed. The power envelope controller includes voltage feedback input circuitry configured to receive a voltage feedback signal representing an internal voltage drop across the amplification stage and current feedback input circuitry configured to receive a current feedback signal representing an output current of the amplification stage. An analog multiplier is configured to generate an internal power dissipation signal representing the internal power dissipation of the amplification stage based on the voltage and current feedback signals. A comparator circuit is configured to compare the internal power dissipation signal to a power threshold and generate a power control error signal when the internal power dissipation of the amplification stage exceeds the threshold.

Abstract: A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

Abstract: An opto-isolated amplifier and method are disclosed. The amplifier includes an input node configured to receive an input to be amplified. A pair of opto-isolators are coupled between an input node and an output node. The opto-isolators are configured to create gain between the input node and the output node. An amplification stage is coupled to the opto-isolators. The amplification stage includes an input coupled to the output node and an output configured to generate an amplified output. The opto-isolator outputs may be configured to generate a difference current. The input of the amplification stage may have a high impedance compared to an impedance at the output node, the difference current being directed at the high input impedance input of the amplification stage to generate a gained voltage.

Abstract: An impedance sourcing circuit for a measurement device configured to measure a device under test (DUT) and method are disclosed. The impedance sourcing circuit includes a voltage/current source. An electrically controlled variable resistance having a control input is configured to adjust the variable resistance is coupled to the DUT. A loop gain controller is coupled to the control input of the electrically controlled variable resistance. The loop gain controller is configured to drive the control input of the electrically controlled variable resistance to adjust the variable resistance to generally match the impedance of the DUT. The impedance sourcing circuit may also include a voltage detector configured to detect a voltage across the DUT and a voltage reference. The loop gain controller may be configured to drive the control input of the electrically controlled variable resistance based on the voltage detected across the DUT and the voltage reference.

Abstract: An active shunt ammeter for measuring current flowing through a device under test (DUT) and method are disclosed. The active shunt ammeter includes an input configured to receive an input signal having a frequency within a frequency band and representing the current flowing through the DUT. An output is configured to generate an output voltage representing the current flowing through the DUT. The active shunt ammeter also includes a gain circuit having an amplifier with a gain characteristic that varies respect to frequency within the frequency band and a feedback element having an impedance coupled from an output of the gain circuit to a negative input of the gain circuit, the feedback element impedance being configured to change with frequency to correlate with the amplifier gain characteristic such that the feedback element impedance divided by the amplifier gain over the frequency band has minimal frequency dependency.

Abstract: A power envelope controller configured for use with an amplification stage and method are disclosed. The power envelope controller includes voltage feedback input circuitry configured to receive a voltage feedback signal representing an internal voltage drop across the amplification stage and current feedback input circuitry configured to receive a current feedback signal representing an output current of the amplification stage. An analog multiplier is configured to generate an internal power dissipation signal representing the internal power dissipation of the amplification stage based on the voltage and current feedback signals. A comparator circuit is configured to compare the internal power dissipation signal to a power threshold and generate a power control error signal when the internal power dissipation of the amplification stage exceeds the threshold.

Abstract: A multiplexor includes an output having a characteristic impedance; a first input having a characteristic impedance equal to the output characteristic impedance; a second input; a first switch path including a first switch operable to connect/disconnect the first input center conductor and the output center conductor; a first input conductive path adjacent to the first switch path and being operable to provide the output characteristic impedance; a second switch path including a second switch operable to connect/disconnect the second input first signal conductor and the output center conductor; and a third switch path including a third switch operable to connect/disconnect the second input second signal conductor and the output intermediate conductor, the third switch path being operable to guard the second switch path when the third switch path is provided with a guard voltage.

Abstract: A dynamic current limiter circuit is disclosed. The dynamic current limiter includes an input node an output node. The dynamic current limiter also includes a current control valve coupled between the input and output nodes, the current control valve being configured to limit current flow between the input and output nodes based on a control input. The dynamic current limiter also includes a current change detector coupled between the input and output nodes, the current change detector being configured to detect a change in current through the input and output nodes and generate a control signal configured to drive the control input. The current control valve is configured to limit current flow between the input and output nodes in response to the current control signal.

Abstract: An opto-isolated amplifier and method are disclosed. The amplifier includes an input node configured to receive an input to be amplified. A pair of opto-isolators are coupled between an input node and an output node. The opto-isolators are configured to create gain between the input node and the output node. An amplification stage is coupled to the opto-isolators. The amplification stage includes an input coupled to the output node and an output configured to generate an amplified output. The opto-isolator outputs may be configured to generate a difference current. The input of the amplification stage may have a high impedance compared to an impedance at the output node, the difference current being directed at the high input impedance input of the amplification stage to generate a gained voltage.

Abstract: An apparatus for testing a DUT includes a pulsed signal source; a hard current-limiter adapted to be operated in series relationship between the pulsed signal source and the DUT; and a voltage sensor adapted to sense a voltage across the DUT in response to the pulsed signal source.

Abstract: Provided is printed circuit board for minimizing dielectric losses experienced by a low-current portion of an electric circuit. The printed circuit board includes a first substrate supporting an electrically-conductive material patterned to form a conductive pathway between electric circuit components, and a surface-mount guard pad provided on a substantially-planar exposed surface of the first substrate and covering at least an area of the exposed surface including a footprint of the low-current portion on the first substrate. A second substrate is also provided with one or more electrically conductive pads that are surface mounted to the guard pad to couple the second substrate to the guard pad. The second substrate also supports a signal trace included in the low-current region for conducting a low-current signal.

Abstract: Provided is a method and system for distributing a test recipe to a tester for conducting a test to determine if a device under test operates as designed. The method includes storing an active test recipe in an active memory in local communication with the tester, and initiating the test of the device under test to be performed by the tester according to a parameter included in the active test recipe stored in the active memory. A second parameter included in a second test recipe is received by the tester while conducting the test of the device under test according to the parameter included in the active test recipe. The method further includes storing the second parameter in a buffer memory in local communication with the active memory, and initiating a transfer of the second parameter from the buffer memory to the active memory.

Abstract: A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

Abstract: A system for making high frequency measurements on a DUT includes a high frequency measurement instrument; a plurality of DUT probes; a first coaxial cable having a center conductor and a coaxial conductor for connection between the instrument and a first DUT probe; and a second coaxial cable having a center conductor and a coaxial conductor for connection between the instrument and a second DUT probe, at least one of the first and second cables being selectively shortable between the respective center conductor and coaxial conductor at a location near the respective DUT probe.

Abstract: A method for operating a measurement system having an interconnect between the measurement system and a device under test (DUT), the interconnect exhibiting voltage drops during measurements of the DUT, includes applying a test signal to the DUT through the interconnect, the test signal having a system value at the measurement system; measuring a resulting DUT value at the DUT; adjusting the system value according to the resulting DUT value to produce successive desired DUT values at the DUT; and using the successive DUT values to measure an electrical characteristic of the DUT.

Abstract: A method for managing Java applets in HTML pages, the HTML pages being rendered by a web browser, includes: browsing a page having an applet, the applet being loaded into the page and creating a connection to a server; leaving the page, the applet providing an idle message to the server and being stored in a cache of applet objects, each object having a connection ID; and returning to the page, the applet being retrieved from the cache based on the connection ID, the applet reloading and providing an activate message to the server to reuse the connection.

Abstract: A switch matrix for selectively connecting at least one of N signal inputs to at least one of M signal outputs, N and M being integers greater than two, includes a cluster of N input switches arranged about each of the M signal outputs resulting in at least M clusters of N input switches, each input switch having a switch input and a switch output, the switch outputs being connected to respective signal outputs, the clusters and the input switches in the clusters being arranged to permit adjacent switch inputs of adjacent clusters to be connected to form input switch nodes; and a steering switch for each of the signal inputs. The steering switch selectably connects a signal input to an input switch node, wherein the combination of the steering switches and the input switches are operable to connect a desired signal input to a desired signal output.

Abstract: An electronic instrument having in its circuitry a specific solid state switch that exhibits detrimental current leakage at elevated temperatures, a variable voltage device in the instrument connected to the specific switch, the variable voltage device being capable, at an experimentally determined voltage setting, of zeroing out the leakage current in the specific switch, the variable voltage device being set at a voltage setting determined experimentally using said specific switch at an elevated temperature thereby temperature compensating said specific switch.

Abstract: A transmission line impedance compensation method includes the step of providing a measurement device that is adapted to source a test signal having a frequency to a device under test and to determine a corresponding impedance of the device under test using an auto-balanced bridge technique. A first transmission line, a second transmission line, a third transmission line, and a fourth transmission line are connected to said measurement device. An end of the first transmission line is connected to an end of second transmission line. An end of third transmission line is connected to an end of fourth transmission line. A combined phase delay of the connected first and second transmission lines, and a combined phase delay of the connected third and fourth transmission lines, are measured by the measuring device. The device under test is connected to the first transmission line, the second transmission line, the third transmission line, and the fourth transmission line after measuring the phase delays.

Abstract: A range-changing circuit for a measurement device having a desirable range includes an array of graduated impedances. And amplifier supplies an electrical voltage to at least one of the impedances of the array. A voltage sensing and limiting switch is provided in a feedback path of the amplifier. The switch limits said electrical voltage supplied to said at least one of the impedances in response to a sensed voltage that is sensed by the switch. An electrical voltage in the desirable range is developed across a different one of the impedances of the array based on an operation of the switch.