Abstract: A safety container for high-power, electronic device testing, the safety container including a first shell and first and second ports in the first shell. The first shell is configured to substantially surround a testing chamber sized to accommodate a device-under-test (DUT). The first shell is substantially rigid. The first port is configured to allow a fluid into the testing chamber, the second port configured to allow the fluid to exit the testing chamber.

Abstract: A voltage source device, including a first voltage source configured to output a first voltage, source pathways to connect the first voltage source to a device under test, sensing pathways electrically coupled to the device under test; and circuitry configured to sample a second voltage at the device under test, determine a voltage difference between the first voltage and the second voltage, and adjust the first voltage based on the difference between the first voltage and the second voltage.

Abstract: A test and measurement instrument switch matrix including a first cable including a center conductor and a guard connected to a first output of the test and measurement instrument; a second cable including a center conductor and a guard connected to a second output of the test and measurement instrument; a third cable including a center conductor and a guard connected to the device under test; and a fourth cable including a center conductor connected to the device under test and a guard connected to the device under test.

Abstract: A test and measurement instrument, includes a user interface, one or more probes configured to connect to a device under test comprising a MOSFET, and one or more processors configured to execute code that causes the one or more processors to: set a target voltage to be measured across the MOSFET, apply a force voltage to the MOSFET, measure a drain current and a drain voltage of the MOSFET with the one or more probes, determine if a difference between the measured drain voltage and the target voltage meets a threshold, when the difference does not meet the threshold, use the measured drain voltage, the measured drain current, and a load resistance to determine a new force voltage value to compensate for the load resistance, set the force voltage to the new force voltage value, and repeat the apply, measure and determine steps as needed.

Abstract: A current source has at least one gain component having a constant gain at frequencies below a frequency point, and having a gain inversely proportional to frequency at frequencies above the frequency point, the gain component having an input and an output, a source resistor connected in series with the output of the gain component, the gain component to regulate a voltage across the source resistor to be a source voltage, such that the gain of the gain component limits regulation by the gain component of the source voltage and an output voltage across a load between a high terminal and a low terminal, and a feedback component to receive at least a portion of the output voltage, the feedback component connected to the input of the gain component, the feedback component configured to reduce the gain of the gain component available to regulate the source voltage across the source resistor.

Abstract: A test and measurement instrument including a voltage source configured to output a source voltage, a current sensor, and one or more processors. The one or more processors are configured to determine an estimation of a load of an unknown connected device under test based on the source voltage, the current sensor, and a voltage of the connected device under test without any prior knowledge of the connected device under test.

Abstract: A digitizing circuit includes a port connectable to a device under test (DUT), an integrating analog-to-digital converter (ADC), a high-speed ADC, one or more processors to apply a digital filter to output samples of the high-speed ADC to produce filtered samples, find differences between the filtered samples and samples from the integrating ADC to produce error values, and add the error values to the output samples of the high-speed ADC. A method of producing a digital signal includes receiving an input analog signal at an integrating analog-to-digital converter (ADC) and a high-speed ADC, applying a digital filter to output samples of the high-speed ADC to produce filtered samples, the digital filter matched to timing and filtering of the integrating ADC, finding differences between the filtered samples to output samples of the integrating ADC to produce error values, and adding the error values to the output samples of the high-speed ADC.

Abstract: A test and measurement instrument including a voltage source configured to output a source voltage, a current sensor, and one or more processors. The one or more processors are configured to determine an estimation of a load of an unknown connected device under test based on the source voltage, the current sensor, and a voltage of the connected device under test without any prior knowledge of the connected device under test.

Abstract: A dual-stage source measure unit (SMU) has a user interface to allow a user to input one or more target values, at least two terminals to couple to a device under test (DUT), a current loop having a current digital control loop (DCL), a current digital-to-analog converter (DAC), a sense resistor, a current analog-to digital converter (ADC), and a common ADC, the current DCL to receive inputs from the current ADC, from the common ADC, and a target value for the output current, and to control a first output stage to produce the output current, and a voltage loop having a voltage DCL, a voltage DAC, a voltage ADC, and the common ADC, the voltage DCL to receive inputs from the voltage ADC, from the common ADC, and a target value for the output voltage, and to control a second output stage to produce the output voltage.

Abstract: A source measure unit has a voltage output stage to provide a voltage across first and second output terminals to connect to a load, and a current output stage to provide a voltage to a first sense resistor, the source measure unit to switchably employ both the voltage output stage and the current output stage for a first range of output current, to regulate a common point, and either output voltage or output current, or employ only one of either the voltage output stage or the current output stage to provide voltage to both the first and second output terminals and a second sense resistor for a second range of output current, and to regulate either output voltage or output current.

Abstract: A configuration device in a test and measurement system including an event generator and a Device Under Test (DUT) to receive one or more events generated by the event generator includes an output display structured to graphically illustrate a first event timeline that includes source event markers for a first test channel for a second test channel, in which the first event timeline and the second event timeline appear on the output display as separate timelines vertically separated from one another. The position of the event delay indicator or a position of the event width indicator may be movable by a user, and moving the position of the event delay indicator or moving the position of the event width indicator causes the event generator to change one or more event generation parameters of the first event based on such movement. Methods are also disclosed.

Abstract: A power supply block has multiple isolated power channels, the power supply comprising an interface magnetic component having multiple windings, each winding connected to a separate one of the isolated channels. A test and measurement instrument has a connector to allow the instrument to connect to a device under test, and a power supply block having multiple isolated power channels, the power supply block comprising an interface magnetic component having multiple windings, each winding connected to a separate one of the isolated power channels.

Abstract: A test and measurement circuit including a capacitor in parallel with a device under test, a direct current voltage source configured to charge the capacitor, a pulse generator configured to generate a pulse for testing the device under test, and a sensor for determining a current in the device under test.

Abstract: A test instrument network, has a plurality of nodes, each node having a connection to the test instrument network with a unique node identifier, one or more script processors, each script processor having a unique group identifier to which resource groups can be allocated, and one or more resource groups, each resource group comprising one or more resources, wherein a node becomes a master node when it either processes a command message or initiates script processing. A method of operating a test instrument network having a plurality of nodes includes processing one or more command messages or scripts at a node having one or more script processors and one or more resource groups, designating the node processing the command message or script as a master node, sending, from a script processor on the master node, an execution request to a resource group, resource groups having a finer allocation level than a node level, and handling the request at a node that controls the resource group.

Abstract: A test and measurement instrument includes a current measurement device having an input to accept an electrical current for measurement, an output to pass an output current output from the current measurement device, a sense path through which the electrical current is measured, and an active bypass device to pass an amount of current from the input of the current measurement device to the output of the current measurement device without passing through the sense path. The active bypass device may be tuned to allow the current sense device to operate without bypass within a specific range of target current values. Some current measurement devices may include more than one active bypass circuits, each tuned for a different range of input current values.

Abstract: A configurable instrument includes a mainframe having one or more processors, a chassis having slots to accept one or more instrument modules, a communication bus coupled to all of the instrument modules inserted in the slots, and a communication backplane, separate from the communication bus, and configured to allow point-to-point communication between any pair of modules inserted in the slots.

Abstract: A safety adapter assembly includes a first electrical connector, a second electrical connector, a connector body, and a safety sleeve. The connector body is structured to couple the first electrical connector to the second electrical connector. The safety sleeve is substantially surrounding the connector body and configured to move relative to the connector body to selectively allow user access to the first electrical connector while substantially blocking user access to the second electrical connector, or to allow user access to the second electrical connector while substantially blocking user access to the first electrical connector.

Abstract: A safety container for high-power, electronic device testing, the safety container including a first shell and first and second ports in the first shell. The first shell is configured to substantially surround a testing chamber sized to accommodate a device-under-test (DUT). The first shell is substantially rigid. The first port is configured to allow a fluid into the testing chamber, the second port configured to allow the fluid to exit the testing chamber.

Abstract: A voltage source device, including a first voltage source configured to output a first voltage, source pathways to connect the first voltage source to a device under test, sensing pathways electrically coupled to the device under test; and circuitry configured to sample a second voltage at the device under test, determine a voltage difference between the first voltage and the second voltage, and adjust the first voltage based on the difference between the first voltage and the second voltage.

Abstract: A configuration device in a test and measurement system including an event generator and a Device Under Test (DUT) to receive one or more events generated by the event generator includes an output display structured to graphically illustrate a first event timeline that includes source event markers for a first test channel for a second test channel, in which the first event timeline and the second event timeline appear on the output display as separate timelines vertically separated from one another. The position of the event delay indicator or a position of the event width indicator may be movable by a user, and moving the position of the event delay indicator or moving the position of the event width indicator causes the event generator to change one or more event generation parameters of the first event based on such movement. Methods are also disclosed.