Abstract: A test and measurement system includes a device under test (DUT) interface structured to couple to first and second DUTs that are coupled to form a half bridge circuit. A characterization circuit is controlled to perform static testing and dynamic testing of the first and second DUTs. The characterization circuit includes a solid-state bias tee including the first DUT and a first drive voltage generator that provides a DC pulse signal and AC signal on a gate node of the first DUT to cause the first DUT to supply current and voltage signals to the second DUT for static and dynamic characterization of the second DUT. One characterization circuit can generate, at the same time, the gate charge characterization parameters for one DUT and reverse current path (e.g., body diode) characterization of another DUT.

Abstract: A power supply block has multiple isolated power channels, the power supply comprising an interface magnetic component having multiple windings, each winding connected to a separate one of the isolated channels. A test and measurement instrument has a connector to allow the instrument to connect to a device under test, and a power supply block having multiple isolated power channels, the power supply block comprising an interface magnetic component having multiple windings, each winding connected to a separate one of the isolated power channels.

Abstract: A test and measurement device is described having one or more capture devices configured to receive an event from a respective event generator. The test and measurement device also includes a broadcaster configured to receive the event from the one or more capture devices and broadcast the event. The test and measurement device also includes one or more comparators configured to receive the event from the batch broadcaster and route the event to a respective event detector based on a comparison of an event identifier and a detector identifier.

Abstract: A digitizing circuit includes a port connectable to a device under test (DUT), an integrating analog-to-digital converter (ADC), a high-speed ADC, one or more processors to apply a digital filter to output samples of the high-speed ADC to produce filtered samples, find differences between the filtered samples and samples from the integrating ADC to produce error values, and add the error values to the output samples of the high-speed ADC. A method of producing a digital signal includes receiving an input analog signal at an integrating analog-to-digital converter (ADC) and a high-speed ADC, applying a digital filter to output samples of the high-speed ADC to produce filtered samples, the digital filter matched to timing and filtering of the integrating ADC, finding differences between the filtered samples to output samples of the integrating ADC to produce error values, and adding the error values to the output samples of the high-speed ADC.

Abstract: A test and measurement system includes a power device having an interface to allow connection to one or more devices under test (DUTs), and one or more processors configured to execute code that, when executed, causes the one or more processors to receive a selection between static and dynamic characterization, and to configure the power device to perform the selected one of static or dynamic characterization of the one or more DUTs, a measurement device, having a user interface, one or more processors configured to execute code that, when executed, causes the one or more processors to: receive user inputs through the user interface, the user inputs including at least the selection between static and dynamic characterization, and send the selected one of static or dynamic characterization to the power device, and a connector to connect the power device to the measurement device.

Abstract: A test and measurement instrument, includes a user interface, one or more probes configured to connect to a device under test comprising a MOSFET, and one or more processors configured to execute code that causes the one or more processors to: set a target voltage to be measured across the MOSFET, apply a force voltage to the MOSFET, measure a drain current and a drain voltage of the MOSFET with the one or more probes, determine if a difference between the measured drain voltage and the target voltage meets a threshold, when the difference does not meet the threshold, use the measured drain voltage, the measured drain current, and a load resistance to determine a new force voltage value to compensate for the load resistance, set the force voltage to the new force voltage value, and repeat the apply, measure and determine steps as needed.

Abstract: The present disclosure describes a test and measurement system with a test and measurement instrument. In addition, the test and measurement system may include an isolation barrier providing galvanic isolation to the test and measurement instrument. The test and measurement system may include a circuit couplable to a device under test (DUT), where the circuit may include: a signal receiver configured to receive signals from the test and measurement instrument through the isolation barrier; an isolated power supply configured to power the circuit via the received signal; a signal generator configured to generate and output an isolated signal to the DUT using the isolated power supply; and a sensor for measuring output signals from the DUT in response to the isolated signal from the signal generator.

Abstract: The present system includes an instrument configured to couple to a device under test, where the instrument is coupled to a local ground and an earth ground, the instrument having: a signal source; a relay coupled to the local ground; a impedance between the first signal source and the relay; and one or more processors configured to execute code that causes the one or more processors to: operate the relay to either connect or disconnect the earth ground to the local ground; measure quality of a first connection to the earth ground and quality of a second connection to the local ground using the instrument, the first signal source, and the first impedance; and determine whether to continue operating the relay to either keep the earth ground connected to or disconnected from the local ground based on the quality of the first connection and the quality of the second connection.

Abstract: A test and measurement instrument is described, having: a current source configured to output a constant current to a device under test (DUT); a voltage sensor configured to sense a voltage to the DUT, where the voltage sensor is configured to: measure a first set of voltages over time while the current source outputs a first current the DUT; measure a second set of voltages over time while the current source outputs a second current to the DUT, the second current having a different polarity to the first current; and measure a third set of voltages over time while the current source outputs a third current to the DUT, the third current having a same polarity as the first current. Furthermore, the test and measurement instrument includes one or more processors configured to derive a capacitance of the DUT based on the second and third currents.

Abstract: In some implementations, a method may include acquiring a first plurality of measurements for the DUT, where the test and measurement instrument is not configured with the characteristic of the DUT and the first plurality of measurements may include measurements for the characteristic. In addition, the method may include determining an exponential model of the DUT based on the first plurality of measurements, where the exponential model is representative of behavior of the DUT. The method may include acquiring a second plurality of measurements different from the first plurality of measurements, where the second plurality of measurements may include measurements for the characteristic of the DUT. Moreover, the method may include verifying the exponential model based on the second plurality of measurements. Also, the method may include adjusting the behavior of the test and measurement instrument based on the verified exponential model of the DUT.

Abstract: A configurable instrument includes a mainframe having one or more processors, a chassis having slots to accept one or more instrument modules, a communication bus coupled to all of the instrument modules inserted in the slots, and a communication backplane, separate from the communication bus, and configured to allow point-to-point communication between any pair of modules inserted in the slots.

Abstract: In some examples, the system may include a parametric system matrix coupled one or more test and measurement instruments. Also, the system may include an adapter circuit coupled to the parametric system matrix, the adapter circuit having a voltage clamping circuit coupled to the parametric system matrix. Furthermore, the system may include a probe circuit coupled to the adapter circuit and to the power device, where the power device is disposed on a wafer.

Abstract: A dual-stage source measure unit (SMU) has a user interface to allow a user to input one or more target values, at least two terminals to couple to a device under test (DUT), a current loop having a current digital control loop (DCL), a current digital-to-analog converter (DAC), a sense resistor, a current analog-to digital converter (ADC), and a common ADC, the current DCL to receive inputs from the current ADC, from the common ADC, and a target value for the output current, and to control a first output stage to produce the output current, and a voltage loop having a voltage DCL, a voltage DAC, a voltage ADC, and the common ADC, the voltage DCL to receive inputs from the voltage ADC, from the common ADC, and a target value for the output voltage, and to control a second output stage to produce the output voltage.

Abstract: A test and measurement instrument including a voltage source configured to output a source voltage, a current sensor, and one or more processors. The one or more processors are configured to determine an estimation of a load of an unknown connected device under test based on the source voltage, the current sensor, and a voltage of the connected device under test without any prior knowledge of the connected device under test.

Abstract: In some examples, the system includes a primary power domain having: a first ground; a first set of measurement devices coupled to the first ground and configured to be powered by at least one of a first set of power supplies; and a second set of measurement devices coupled to the first ground and configured to be powered by at least one of the first set of power supplies. In addition, the system includes at least two isolated secondary power domains coupled to the primary power domain, each having: a second ground different from the first ground; a transformer coupled to the primary power domain, to a second set of power supplies, and to the second ground; and a third set of measurement devices coupled to the second ground and configured to be powered by at least one of the second set of power supplies.

Abstract: A safety container for high-power, electronic device testing, the safety container including a first shell and first and second ports in the first shell. The first shell is configured to substantially surround a testing chamber sized to accommodate a device-under-test (DUT). The first shell is substantially rigid. The first port is configured to allow a fluid into the testing chamber, the second port configured to allow the fluid to exit the testing chamber.

Abstract: A voltage source device, including a first voltage source configured to output a first voltage, source pathways to connect the first voltage source to a device under test, sensing pathways electrically coupled to the device under test; and circuitry configured to sample a second voltage at the device under test, determine a voltage difference between the first voltage and the second voltage, and adjust the first voltage based on the difference between the first voltage and the second voltage.

Abstract: A test and measurement instrument switch matrix including a first cable including a center conductor and a guard connected to a first output of the test and measurement instrument; a second cable including a center conductor and a guard connected to a second output of the test and measurement instrument; a third cable including a center conductor and a guard connected to the device under test; and a fourth cable including a center conductor connected to the device under test and a guard connected to the device under test.

Abstract: A test and measurement instrument, includes a user interface, one or more probes configured to connect to a device under test comprising a MOSFET, and one or more processors configured to execute code that causes the one or more processors to: set a target voltage to be measured across the MOSFET, apply a force voltage to the MOSFET, measure a drain current and a drain voltage of the MOSFET with the one or more probes, determine if a difference between the measured drain voltage and the target voltage meets a threshold, when the difference does not meet the threshold, use the measured drain voltage, the measured drain current, and a load resistance to determine a new force voltage value to compensate for the load resistance, set the force voltage to the new force voltage value, and repeat the apply, measure and determine steps as needed.

Abstract: A current source has at least one gain component having a constant gain at frequencies below a frequency point, and having a gain inversely proportional to frequency at frequencies above the frequency point, the gain component having an input and an output, a source resistor connected in series with the output of the gain component, the gain component to regulate a voltage across the source resistor to be a source voltage, such that the gain of the gain component limits regulation by the gain component of the source voltage and an output voltage across a load between a high terminal and a low terminal, and a feedback component to receive at least a portion of the output voltage, the feedback component connected to the input of the gain component, the feedback component configured to reduce the gain of the gain component available to regulate the source voltage across the source resistor.