Patents Assigned to Kenco Alloy & Chemical Co. Inc.
  • Means and method for measuring levels of ionic contamination
    Patent number: 4023931
    Abstract: A system and method for measuring ionic contamination of an electronic assembly includes the steps of providing a test solution of a known ionic content; placing an electronic assembly of known exposed area into a predetermined static volume of the test solution; thereafter measuring the ionic content of the test solution to provide a measurement of the ionic contamination of said assembly.
    Type: Grant
    Filed: February 17, 1976
    Date of Patent: May 17, 1977
    Assignee: Kenco Alloy & Chemical Co. Inc.
    Inventor: Edgar W. Wolfgram