Abstract: Described is a lateral flow high throughput assay device analyzer for preparing and analyzing a plurality of lateral flow assay samples. The analyzer comprises a cartridge stage for supporting an assay cartridge, an elevation adjustment mechanism, and a translation adjustment mechanism for aligning the cartridge stage and assay cartridge relative to a vertical support structure, fluid metering device, and detection device for high throughput lateral flow assay analysis.
Type:
Grant
Filed:
December 20, 2019
Date of Patent:
September 10, 2024
Assignee:
Kenota Inc.
Inventors:
Christopher J. Harder, David Andrew McMullin, Eric Blondeel, Kien Vu