Patents Assigned to KIRIN TECHNO-SYSTEMS COMPANY, LIMITED
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Patent number: 9194814Abstract: The present invention relates to a glass bottle inspection apparatus which can detect a defect at a specific location such as a bottle-mouth portion of a glass bottle by an imaging process. The glass bottle inspection apparatus includes an inspection unit having one or plural illuminating units (LED1 through LED6) configured to illuminate a glass bottle (1) and at least one camera (CAM1 through CAM4) configured to image light reflected from the glass bottle (1), configured to detect a defect at a specific location of the glass bottle. The apparatus has a controller (4) configured to control operations of the one or plural illuminating units (LED1 through LED6) and the camera (CAM1 through CAM4). The controller (4) controls the one or plural illuminating units (LED1 through LED6) individually to emit a pulsed light in synchronism with an image capturing timing of the camera (CAM1 through CAM4).Type: GrantFiled: September 28, 2011Date of Patent: November 24, 2015Assignee: KIRIN TECHNO-SYSTEM COMPANY, LIMITEDInventor: Masaaki Numazu
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Patent number: 9147241Abstract: The glass bottle inspection method and apparatus performs successively producing differential images from original images successively captured from the glass bottle to be inspected while the glass bottle is being rotated about its own axis, comparing the differential images with the template to judge whether the glass bottle is defect-free or not, and combining all the differential images obtained from the glass bottle to be inspected in one inspection cycle to produce a differential composite image, using the differential composite image as a provisional template when all the differential images obtained from the glass bottle in one inspection cycle are judged as representing a defect-free glass bottle, and correcting the template using the provisional template.Type: GrantFiled: June 15, 2011Date of Patent: September 29, 2015Assignee: KIRIN TECHNO-SYSTEM COMPANY, LIMITEDInventor: Masaaki Numazu
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Publication number: 20140119634Abstract: The glass bottle inspection method and apparatus performs successively producing differential images from original images successively captured from the glass bottle to be inspected while the glass bottle is being rotated about its own axis, comparing the differential images with the template to judge whether the glass bottle is defect-free or not, and combining all the differential images obtained from the glass bottle to be inspected in one inspection cycle to produce a differential composite image, using the differential composite image as a provisional template when all the differential images obtained from the glass bottle in one inspection cycle are judged as representing a defect-free glass bottle, and correcting the template using the provisional template.Type: ApplicationFiled: June 15, 2011Publication date: May 1, 2014Applicant: KIRIN TECHNO-SYSTEM COMPANY, LIMITEDInventor: Masaaki Numazu
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Publication number: 20130222575Abstract: The present invention relates to a glass bottle inspection apparatus which can detect a defect at a specific location such as a bottle-mouth portion of a glass bottle by an imaging process. The glass bottle inspection apparatus includes an inspection unit having one or plural illuminating units (LED1 through LED6) configured to illuminate a glass bottle (1) and at least one camera (CAM1 through CAM4) configured to image light reflected from the glass bottle (1), configured to detect a defect at a specific location of the glass bottle. The apparatus has a controller (4) configured to control operations of the one or plural illuminating units (LED1 through LED6) and the camera (CAM1 through CAM4). The controller (4) controls the one or plural illuminating units (LED1 through LED6) individually to emit a pulsed light in synchronism with an image capturing timing of the camera (CAM1 through CAM4).Type: ApplicationFiled: September 28, 2011Publication date: August 29, 2013Applicant: KIRIN TECHNO-SYSTEM COMPANY, LIMITEDInventor: Masaaki Numazu
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Patent number: 8351679Abstract: A surface inspection apparatus, which includes a detecting device of scanning a surface of an inspection object with an inspection light and outputting a signal corresponding to a light amount of refection light from the surface, generates a two-dimensional image of the surface of the inspection object on the basis of the output signal of the detecting device (S1), classifies pixels contained in the two-dimensional image into a first group of pixels having tones corresponding to defects on the surface of the inspection object and a second group of pixels having tones not corresponding to the defects, extracts the first group of pixels as a defect candidate part for each region surrounded by second groups of pixels (S3 to S5), discriminates a defect candidate part larger than a prescribed size as a defect (S6), inspects the two-dimensional image for each specific inspection region, and identifies an inspection region as a defect region, in which density of defect candidate parts that are smaller than the prescType: GrantFiled: May 16, 2007Date of Patent: January 8, 2013Assignee: Kirin Techno-System Company, LimitedInventor: Yukiko Fukami
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Patent number: 7944554Abstract: A pair of angular contact bearings 20A, 20B are disposed between a bearing house 16b of an inspection head 16 and a head supporting tube 8, and a spacer 25 and a spring bearing ring 26 are disposed between outer races 20o of the bearings 20A, 20B. The spacer 25 and the spring bearing ring 26 are urged by a coil spring 27 toward the side of the outer race 20o. An O-ring 28 is disposed between the spacer 25 and the outer race 20o of the bearing 20B, and the outer circumference of the O-ring is brought into closely contact with the inner circumference of the bearing house 16b. The outer races 20o are constrained by a step part 16f in the bearing house 16b and an end cap 29 screwed into the inspection head 16. Removing the end cap 29 makes it possible to take out the bearing housing 16b and a main shaft part 16c integrally from atop of the bearings 20A, 20B.Type: GrantFiled: May 16, 2007Date of Patent: May 17, 2011Assignee: Kirin Techno-System Company, LimitedInventors: Kazuhiro Horiuchi, Tatsunari Arito
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Publication number: 20090262354Abstract: A pair of angular contact bearings 20A, 20B are disposed between a bearing house 16b of an inspection head 16 and a head supporting tube 8, and a spacer 25 and a spring bearing ring 26 are disposed between outer races 20o of the bearings 20A, 20B. The spacer 25 and the spring bearing ring 26 are urged by a coil spring 27 toward the side of the outer race 20o. An O-ring 28 is disposed between the spacer 25 and the outer race 20o of the bearing 20B, and the outer circumference of the O-ring is brought into closely contact with the inner circumference of the bearing house 16b. The outer races 20o are constrained by a step part 16f in the bearing house 16b and an end cap 29 screwed into the inspection head 16. Removing the end cap 29 makes it possible to take out the bearing housing 16b and a main shaft part 16c integrally from atop of the bearings 20A, 20B.Type: ApplicationFiled: May 16, 2007Publication date: October 22, 2009Applicants: KIRIN TECHNO-SYSTEMS COMPANY, LIMITED, KTS OPTICS CORPORATIONInventors: Kazuhiro Horiuchi, Tatsunari Arito
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Publication number: 20090148031Abstract: A surface inspection apparatus, which includes a detecting device of scanning a surface of an inspection object with an inspection light and outputting a signal corresponding to a light amount of refection light from the surface, generates a two-dimensional image of the surface of the inspection object on the basis of the output signal of the detecting device (S1), classifies pixels contained in the two-dimensional image into a first group of pixels having tones corresponding to defects on the surface of the inspection object and a second group of pixels having tones not corresponding to the defects, extracts the first group of pixels as a defect candidate part for each region surrounded by second groups of pixels (S3 to S5), discriminates a defect candidate part larger than a prescribed size as a defect (S6), inspects the two-dimensional image for each specific inspection region, and identifies an inspection region as a defect region, in which density of defect candidate parts that are smaller than the prescType: ApplicationFiled: May 16, 2007Publication date: June 11, 2009Applicant: KIRIN TECHNO-SYSTEM COMPANY, LIMITEDInventor: Yukiko Fukami