Patents Assigned to KITA USA
  • Biasing method and device construction for a spring probe
    Patent number: 9910069
    Abstract: A device for testing integrated circuits utilizing a compression spring that has one longitudinal centerline that is concentric to the housing of the test probe and terminates in a number of reduced diameter coil windings that are non-concentric to the housing so as to provide a side load to the probe.
    Type: Grant
    Filed: April 24, 2015
    Date of Patent: March 6, 2018
    Assignee: KITA USA
    Inventors: Larre H. Nelson, John M. Winter, Yoshihide Kimura